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Results: 1
Front side and backside OBIT mappings applied to single event transient testing
Authors:
Lewis, D Pouget, V Beauchene, T Lapuyade, H Fouillat, P Touboul, A Beaudoin, F Perdu, P
Citation:
D. Lewis et al., Front side and backside OBIT mappings applied to single event transient testing, MICROEL REL, 41(9-10), 2001, pp. 1471-1476
Risultati:
1-1
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