Authors: Boer, EA Bell, LD Brongersma, ML Atwater, HA

Citation: Ea. Boer et al., Models for quantitative charge imaging by atomic force microscopy, J APPL PHYS, 90(6), 2001, pp. 2764-2772

Authors: Ostraat, ML De Blauwe, JW Green, ML Bell, LD Atwater, HA Flagan, RC

Citation: Ml. Ostraat et al., Ultraclean two-stage aerosol reactor for production of oxide-passivated silicon nanoparticles for novel memory devices, J ELCHEM SO, 148(5), 2001, pp. G265-G270

Authors: Boer, EA Brongersma, ML Atwater, HA Flagan, RC Bell, LD

Citation: Ea. Boer et al., Localized charge injection in SiO2 films containing silicon nanocrystals, APPL PHYS L, 79(6), 2001, pp. 791-793

Authors: Ostraat, ML De Blauwe, JW Green, ML Bell, LD Brongersma, ML Casperson, J Flagan, RC Atwater, HA

Citation: Ml. Ostraat et al., Synthesis and characterization of aerosol silicon nanocrystal nonvolatile floating-gate memory devices, APPL PHYS L, 79(3), 2001, pp. 433-435

Authors: Boer, EA Bell, LD Brongersma, ML Atwater, HA Ostraat, ML Flagan, RC

Citation: Ea. Boer et al., Charging of single Si nanocrystals by atomic force microscopy, APPL PHYS L, 78(20), 2001, pp. 3133-3135

Authors: Bell, LD Smith, RP McDermott, BT Gertner, ER Pittman, R Pierson, RL Sullivan, GJ

Citation: Ld. Bell et al., Modification of GaN Schottky barrier interfaces probed by ballistic-electron-emission microscopy and spectroscopy, APPL PHYS L, 76(13), 2000, pp. 1725-1727