ACNP - Italian Periodicals Catalogue

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Results: 1-10 |

Results: 10

Accounting for photosynthetic efficiency of bean leaves with rust, angularleaf spot and anthracnose to assess crop damage

Authors: Bassanezi, RB Amorim, L Bergamin, A Hau, B Berger, RD

Citation: Rb. Bassanezi et al., Accounting for photosynthetic efficiency of bean leaves with rust, angularleaf spot and anthracnose to assess crop damage, PLANT PATH, 50(4), 2001, pp. 443-452

Effects of angular leaf spot and rust on yield loss of Phaseolus vulgaris

Authors: de Jesus, WC do Vale, FXR Coelho, RR Hau, B Zambolim, L Costa, LC Bergamin, A

Citation: Wc. De Jesus et al., Effects of angular leaf spot and rust on yield loss of Phaseolus vulgaris, PHYTOPATHOL, 91(11), 2001, pp. 1045-1053

Combined optical and X-ray interferometry for high-precision dimensional metrology

Authors: Basile, G Becker, P Bergamin, A Cavagnero, G Franks, A Jackson, K Kuetgens, U Mana, G Palmer, EW Robbie, CJ Stedman, M Stumpel, J Yacoot, A Zosi, G

Citation: G. Basile et al., Combined optical and X-ray interferometry for high-precision dimensional metrology, P ROY SOC A, 456(1995), 2000, pp. 701-729

Simulation of the thermoelastic behavior of an LLL x-ray interferometer

Authors: Bergamin, A Cavagnero, G Mana, G Massa, E Zosi, G

Citation: A. Bergamin et al., Simulation of the thermoelastic behavior of an LLL x-ray interferometer, REV SCI INS, 71(4), 2000, pp. 1716-1722

Measuring small lattice distortions in Si-crystals by phase-contrast x-raytopography

Authors: Bergamin, A Cavagnero, G Mana, G Massa, E Zosi, G

Citation: A. Bergamin et al., Measuring small lattice distortions in Si-crystals by phase-contrast x-raytopography, J PHYS D, 33(21), 2000, pp. 2678-2682

A Fourier optics model of two-beam scanning laser interferometers

Authors: Bergamin, A Cavagnero, G Cordiali, L Mana, G

Citation: A. Bergamin et al., A Fourier optics model of two-beam scanning laser interferometers, EUR PHY J D, 5(3), 1999, pp. 433-440

Scanning X-ray interferometry and the silicon lattice parameter: towards 10(-9) relative uncertainty?

Authors: Bergamin, A Cavagnero, G Mana, G Zosi, G

Citation: A. Bergamin et al., Scanning X-ray interferometry and the silicon lattice parameter: towards 10(-9) relative uncertainty?, EUR PHY J B, 9(2), 1999, pp. 225-232

Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals

Authors: Bergamin, A Cavagnero, G Mana, G Massa, E Zosi, G

Citation: A. Bergamin et al., Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals, MEAS SCI T, 10(6), 1999, pp. 549-553

Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals (vol 10, pg 549, 1999)

Authors: Bergamin, A Cavagnero, G Mana, G Massa, E Zosi, G

Citation: A. Bergamin et al., Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals (vol 10, pg 549, 1999), MEAS SCI T, 10(12), 1999, pp. 1353-1353

Morphological characteristics of sugarcane clones, susceptible and resistant to smut (Ustilago scitaminea)

Authors: da Gloria, BA Albernas, MCC Amorim, L Bergamin, A

Citation: Ba. Da Gloria et al., Morphological characteristics of sugarcane clones, susceptible and resistant to smut (Ustilago scitaminea), SUGARCANE PATHOLOGY, VOL 1, 1999, pp. 167-182

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