Authors:
Borsoni, G
Le Roux, V
Laffitte, R
Kerdiles, S
Bechu, N
Vallier, L
Korwin-Pawlowski, ML
Vannuffel, C
Bertin, F
Vergnaud, C
Chabli, A
Wyon, C
Citation: G. Borsoni et al., Dependence of ultra-thin SiO2 layers formation by ultra-slow single and multicharged ions on process conditions, MICROEL ENG, 59(1-4), 2001, pp. 311-315
Authors:
Caccia, JL
Bertin, F
Campistron, B
Klaus, V
Pointin, Y
van Baelen, J
Wilson, R
Citation: Jl. Caccia et al., Cut-off low monitoring by the French VHF-ST-radar network during the ESTIME campaign, J ATMOS S-P, 62(8), 2000, pp. 639-651
Authors:
Aboyans, V
Cassat, C
Lacroix, P
Tapie, P
Tabaraud, F
Pesteil, F
Bertin, F
Laskar, M
Virot, P
Citation: V. Aboyans et al., Is the morning peak of acute myocardial infarction's onset due to sleep-related breathing disorders? A prospective study, CARDIOLOGY, 94(3), 2000, pp. 188-192
Authors:
Aboyans, V
Lacroix, P
Waruingi, W
Bertin, F
Pesteil, F
Vergnenegre, A
Laskar, M
Citation: V. Aboyans et al., French translation and validation of the Edinburgh questionnaire for the diagnosis of intermittent limping., ARCH MAL C, 93(10), 2000, pp. 1173-1177
Authors:
Bertin, F
van Velthoven, PFJ
Bessemoulin, P
Ney, R
Massebeuf, M
Citation: F. Bertin et al., Wave-turbulence interactions observed in the lower stratosphere by the PROUST UHF radar and GPS radiosoundings, J ATMOS S-P, 61(9), 1999, pp. 663-673
Authors:
Malliavin, MJ
Acher, O
Boscher, C
Bertin, F
Larin, VS
Citation: Mj. Malliavin et al., High-frequency permeability of thin amorphous wires with various anisotropic fields, J MAGN MAGN, 197, 1999, pp. 420-422
Authors:
Bertin, F
Baron, T
Mariolle, D
Martin, F
Chabli, A
Dupuy, M
Citation: F. Bertin et al., Characterization of deposited nanocrystalline silicon by spectroscopic ellipsometry, PHYS ST S-A, 175(1), 1999, pp. 405-412
Authors:
Mechin, L
Chabli, A
Bertin, F
Burdin, M
Rolland, G
Vannuffel, C
Villegier, JC
Citation: L. Mechin et al., A combined x-ray specular reflectivity and spectroscopic ellipsometry study of CeO2/yttria-stabilized-zirconia bilayers on Si(100) substrates, J APPL PHYS, 84(9), 1998, pp. 4935-4940