Authors: Pinnow, CU Bicker, M Geyer, U Schneider, S Goerigk, G

Citation: Cu. Pinnow et al., Decomposition and nanocrystallization in reactively sputtered amorphous Ta-Si-N thin films, J APPL PHYS, 90(4), 2001, pp. 1986-1991

Authors: Bicker, M Pinnow, CU Geyer, U Schneider, S Seibt, M

Citation: M. Bicker et al., Nanocrystallization of amorphous-Ta40Si14N46 diffusion barrier thin films, APPL PHYS L, 78(23), 2001, pp. 3618-3620

Authors: Laudahn, U Pundt, A Bicker, M von Hulsen, U Geyer, U Wagner, T Kirchheim, R

Citation: U. Laudahn et al., Hydrogen-induced stress in Nb single layers, J ALLOY COM, 295, 1999, pp. 490-494

Authors: Laudahn, U Fahler, S Krebs, HU Pundt, A Bicker, M Hulsen, UV Geyer, U Kirchheim, R

Citation: U. Laudahn et al., Determination of elastic constants in thin films using hydrogen loading, APPL PHYS L, 74(5), 1999, pp. 647-649