Authors: Biffl, S

Citation: S. Biffl, Using inspection data for defect estimation, IEEE SOFTW, 17(6), 2000, pp. 36

Authors: Freimut, B Laitenberger, O Biffl, S

Citation: B. Freimut et al., Investigating the impact of reading techniques on the accuracy of different defect content estimation techniques, SEVENTH INTERNATIONAL SOFTWARE METRICS SYMPOSIUM - METRICS 2001, PROCEEDINGS, 2000, pp. 51-62

Authors: Biffl, S Gutjahr, W

Citation: S. Biffl et W. Gutjahr, Influence of team size and defect detection technique on inspection effectiveness, SEVENTH INTERNATIONAL SOFTWARE METRICS SYMPOSIUM - METRICS 2001, PROCEEDINGS, 2000, pp. 63-75