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Results: 1-4 |
Results: 4
Development of multilayer coatings and spin-off to XRL applications
Authors: Bijkerk, F
Citation: F. Bijkerk, Development of multilayer coatings and spin-off to XRL applications, J PHYS IV, 11(PR2), 2001, pp. 509-510
Determination of the layered structure in Mo/Si multilayers by grazing incidence X-ray reflectometry
Authors: Yakshin, AE Louis, E Gorts, PC Maas, ELG Bijkerk, F
Citation: Ae. Yakshin et al., Determination of the layered structure in Mo/Si multilayers by grazing incidence X-ray reflectometry, PHYSICA B, 283(1-3), 2000, pp. 143-148
Peak and Integrated reflectivity, wavelength and gamma optimization of Mo/Si, and Mo/Be multilayer, multielement optics for extreme ultraviolet lithography
Authors: Stuik, R Louis, E Yakshin, AE Gorts, PC Maas, ELG Bijkerk, F Schmitz, D Scholze, F Ulm, G Haidl, M
Citation: R. Stuik et al., Peak and Integrated reflectivity, wavelength and gamma optimization of Mo/Si, and Mo/Be multilayer, multielement optics for extreme ultraviolet lithography, J VAC SCI B, 17(6), 1999, pp. 2998-3002
Development of low-energy x-ray fluorescence micro-distribution analysis using a laser plasma x-ray source and multilayer optics?
Authors: Stuik, R Shmaenok, LA Fledderus, H Andreev, SS Shamov, EA Zuev, SY Salashchenko, NN Bijkerk, F
Citation: R. Stuik et al., Development of low-energy x-ray fluorescence micro-distribution analysis using a laser plasma x-ray source and multilayer optics?, J ANAL ATOM, 14(3), 1999, pp. 387-390
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