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Results:
1-17
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Results: 17
Authors:
Peiris, FC
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., Determination of the indices of retraction of molecular-beam-epitaxy-grownZnSe/ZnCdSe multiple-quantum-well structures, J VAC SCI B, 19(4), 2001, pp. 1497-1500
Authors:
Peiris, FC
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., Optical properties of molecular beam epitaxy-grown ZnSexTe1-xII-VI semiconductor alloys, J ELEC MAT, 30(6), 2001, pp. 677-681
Authors:
Rhyne, JJ
Stumpe, LE
Kaiser, H
Lee, S
Bindley, U
Furdyna, JK
Citation: Jj. Rhyne et al., Enhancement of interlayer spin coupling in ZnTe/MnTe superlattices by Cl doping, J MAGN MAGN, 226, 2001, pp. 1808-1810
Authors:
Peiris, FC
Bindley, U
Furdyna, JK
Kim, H
Ramdas, AK
Grimsditch, M
Citation: Fc. Peiris et al., Determination of the dispersion of the index of refraction and the elasticmoduli for molecular-beam-epitaxy-grown Zn1-xBexSe alloys, APPL PHYS L, 79(4), 2001, pp. 473-475
Authors:
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., Precise and efficient ex situ technique for determining compositions and growth rates in molecular-beam epitaxy grown semiconductor alloys, J VAC SCI B, 18(3), 2000, pp. 1443-1447
Authors:
Lee, S
Bindley, U
Furdyna, JK
Reimer, PM
Buschert, JR
Citation: S. Lee et al., Controlled growth of ZnSeTe superlattices with sinusoidal compositional modulation, J VAC SCI B, 18(3), 2000, pp. 1518-1521
Authors:
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., Precise measurements of the dispersion of the index of refraction for Cd1-xZnxTe alloys, J ELEC MAT, 29(6), 2000, pp. 798-803
Authors:
Lee, S
Yang, G
Liu, X
Bindley, U
Dobrowolska, M
Furdyna, JK
Reimer, PM
Buschert, JR
Citation: S. Lee et al., Fabrication and optical properties of ZnSeTe superlattices with sinusoidalcompositional modulation, J CRYST GR, 214, 2000, pp. 25-29
Authors:
Stumpe, LE
Rhyne, JJ
Kaiser, H
Lee, S
Bindley, U
Furdyna, JK
Citation: Le. Stumpe et al., Enhancement of spin correlations in ZnTe/MnTe superlattices by Cl doping, J APPL PHYS, 87(9), 2000, pp. 6460-6462
Authors:
Sparing, LM
Mintairov, AM
Hodak, JH
Martini, IB
Hartland, GV
Bindley, U
Lee, S
Furdyna, JK
Merz, JL
Snider, GL
Citation: Lm. Sparing et al., Effect of ion induced damage on carrier lifetimes in strained CdZnSe/ZnSe quantum wells, J APPL PHYS, 87(6), 2000, pp. 3063-3067
Authors:
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., Refractive index measurements of ZnSe-based ternary epitaxial layers grownby molecular-beam epitaxy on GaAs (100), J VAC SCI B, 17(3), 1999, pp. 1214-1217
Authors:
Mintairov, AM
Raymond, S
Merz, JL
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Mintairov, AM
Melehin, VG
Sadchikov, K
Citation: Am. Mintairov et al., Optical spectra of wide band gap BexZn1-xSe alloys, SEMICONDUCT, 33(9), 1999, pp. 1021-1023
Authors:
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., Molecular-beam-epitaxy-grown ZnSe/ZnTe high-reflectivity distributed Braggreflectors, SEMIC SCI T, 14(9), 1999, pp. 878-882
Authors:
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Stuckey, AM
Martin, MR
Buschert, JR
Citation: Fc. Peiris et al., Characterization of MBE-grown II-VI semiconductor distributed Bragg reflectors, J CRYST GR, 202, 1999, pp. 1040-1043
Authors:
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., ZnMgSe ZnCdSe and ZnMgSe ZnSeTe distributed Bragg reflectors grown by molecular beam epitaxy, J APPL PHYS, 86(2), 1999, pp. 719-724
Authors:
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., Wavelength dependence of the indices of refraction of molecular beam epitaxy-grown ZnMgSe and ZnCdSe thin films measured by two complementary techniques, J APPL PHYS, 86(2), 1999, pp. 918-922
Authors:
Peiris, FC
Lee, S
Bindley, U
Furdyna, JK
Citation: Fc. Peiris et al., A prism coupler technique for characterizing thin film II-VI semiconductorsystems, J APPL PHYS, 84(9), 1998, pp. 5194-5197
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