Authors:
Pau, S
Trimble, LE
Blatchford, JW
Watson, GP
Frackoviak, J
Cirelli, R
Nalamasu, O
Citation: S. Pau et al., Focus drilling and attenuated phase shift mask for subwavelength contact window printing using positive and negative resists, J VAC SCI B, 17(6), 1999, pp. 2499-2506