Authors: Peng, CB Liang, RG Erwin, JK Bletscher, W Nagata, K Mansuripur, M

Citation: Cb. Peng et al., Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements, APPL OPTICS, 40(28), 2001, pp. 5088-5099

Authors: Mansuripur, M Erwin, JK Bletscher, W Khulbe, P Sadeghi, K Xun, XD Gupta, A Mendes, SB

Citation: M. Mansuripur et al., Static tester for characterization of phase-change, dye-polymer, and magneto-optical media for optical data storage, APPL OPTICS, 38(34), 1999, pp. 7095-7104