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Results: 1-10 |
Results: 10

Authors: Bodart, F Patel, A Sim, M Weber, R
Citation: F. Bodart et al., Should optional properties be used in conceptual modelling? A theory and three empirical tests, INF SYST R, 12(4), 2001, pp. 384-405

Authors: Roquiny, P Mathot, G Terwagne, G Bodart, F van den Brande, P
Citation: P. Roquiny et al., Nucleation study of titanium nitride onto steel using N-15(p,alpha gamma)C-12 resonant nuclear reaction, NUCL INST B, 161, 2000, pp. 600-604

Authors: Terwagne, G Colaux, J Collins, GA Bodart, F
Citation: G. Terwagne et al., Structural and quantitative analysis of nitrided stainless steel coatings deposited by dc-magnetron sputtering, THIN SOL FI, 377, 2000, pp. 441-446

Authors: Hermans, J Bodart, F Francois, D Merlo, P Fauconnier, JP Schmitz, A Gerard, R de Ruyver, D Eeckhoudt, L
Citation: J. Hermans et al., Scintimammography: a new imaging technique for diagnosis and follow-up of breast cancer, B CANCER, 87(4), 2000, pp. 334-340

Authors: Roquiny, P Bodart, F Terwagne, G
Citation: P. Roquiny et al., Colour control of titanium nitride coatings produced by reactive magnetronsputtering at temperature less than 100 degrees C, SURF COAT, 119, 1999, pp. 278-283

Authors: Jacobs, M Terwagne, G Roquiny, P Bodart, F
Citation: M. Jacobs et al., Unbalanced magnetron sputtered Si-Al coatings: plasma conditions and film properties versus sample bias voltage, SURF COAT, 119, 1999, pp. 735-741

Authors: Terwagne, G Bodart, F Demortier, G
Citation: G. Terwagne et al., Depth profiling of light elements using a nuclear microprobe, NUCL INST B, 158(1-4), 1999, pp. 228-235

Authors: Terwagne, G Bodart, F
Citation: G. Terwagne et F. Bodart, Aluminium and silicon determination on two Si-Al sputter targets used for magnetron sputtering, NUCL INST B, 158(1-4), 1999, pp. 683-688

Authors: Jacobs, M Bodart, F Terwagne, G Schryvers, D Poulet, A
Citation: M. Jacobs et al., Nanohardness and structure of nitrogen implanted SixAly coatings post-implanted with oxygen, NUCL INST B, 147(1-4), 1999, pp. 231-237

Authors: Roquiny, P Poulet, A Leys, Y Descamps, JC Bodart, F VandenBrande, P
Citation: P. Roquiny et al., Comparative study of thin film physical properties for TiNx deposited by DC magnetron sputtering under temperatures less than 100 degrees C on monocrystalline silicon and polycrystalline iron substrates, THIN SOL FI, 356, 1999, pp. 357-362
Risultati: 1-10 |