Authors: Xu, Q Hsu, JWP Carlin, JA Sieg, RM Boeckl, JJ Ringel, SA

Citation: Q. Xu et al., Topographic and electronic studies of wedge-shape surface defects on AlGaAs/GaAs films grown on Ge substrates, APPL PHYS L, 75(14), 1999, pp. 2111-2113