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Results:
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Results: 3
Models for quantitative charge imaging by atomic force microscopy
Authors:
Boer, EA Bell, LD Brongersma, ML Atwater, HA
Citation:
Ea. Boer et al., Models for quantitative charge imaging by atomic force microscopy, J APPL PHYS, 90(6), 2001, pp. 2764-2772
Localized charge injection in SiO2 films containing silicon nanocrystals
Authors:
Boer, EA Brongersma, ML Atwater, HA Flagan, RC Bell, LD
Citation:
Ea. Boer et al., Localized charge injection in SiO2 films containing silicon nanocrystals, APPL PHYS L, 79(6), 2001, pp. 791-793
Charging of single Si nanocrystals by atomic force microscopy
Authors:
Boer, EA Bell, LD Brongersma, ML Atwater, HA Ostraat, ML Flagan, RC
Citation:
Ea. Boer et al., Charging of single Si nanocrystals by atomic force microscopy, APPL PHYS L, 78(20), 2001, pp. 3133-3135
Risultati:
1-3
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