Authors: Boggild, P Hansen, TM Tanasa, C Grey, F

Citation: P. Boggild et al., Fabrication and actuation of customized nanotweezers with a 25 nm gap, NANOTECHNOL, 12(3), 2001, pp. 331-335

Authors: Hasegawa, S Sato, N Shiraki, I Petersen, CL Boggild, P Hansen, TM Nagao, T Grey, F

Citation: S. Hasegawa et al., Surface-state bands on silicon - Si(111)-root 3 x root 3-Ag surface superstructure, JPN J A P 1, 39(6B), 2000, pp. 3815-3822

Authors: Boggild, P Grey, F Hassenkam, T Greve, DR Bjornholm, T

Citation: P. Boggild et al., Direct measurement of the microscale conductivity of conjugated polymer monolayers, ADVAN MATER, 12(13), 2000, pp. 947

Authors: Shiraki, I Nagao, T Hasegawa, S Petersen, CL Boggild, P Hansen, TH Grey, F

Citation: I. Shiraki et al., Micro-four-point probes in a UHV scanning electron microscope for in-situ surface-conductivity measurements, SURF REV L, 7(5-6), 2000, pp. 533-537

Authors: Boggild, P Hansen, TM Kuhn, O Grey, F Junno, T Montelius, L

Citation: P. Boggild et al., Scanning nanoscale multiprobes for conductivity measurements, REV SCI INS, 71(7), 2000, pp. 2781-2783

Authors: Boggild, P Kristensen, A Lindelof, PE

Citation: P. Boggild et al., Magnetic focusing in triangular electron billiards, PHYS REV B, 59(20), 1999, pp. 13067-13072