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Authors: Copel, M Cartier, E Gusev, EP Guha, S Bojarczuk, N Poppeller, M
Citation: M. Copel et al., Robustness of ultrathin aluminum oxide dielectrics on Si(001) (vol 78, pg 2670, 2001), APPL PHYS L, 78(26), 2001, pp. 4199-4199

Authors: Copel, M Cartier, E Gusev, EP Guha, S Bojarczuk, N Poppeller, M
Citation: M. Copel et al., Robustness of ultrathin aluminum oxide dielectrics on Si(001), APPL PHYS L, 78(18), 2001, pp. 2670-2672
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