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Results: 1-17 |
Results: 17
Ce 5d and Fe 3d magnetic profiles in CeH2/Fe multilayers probed by XRMS
Authors: Jaouen, N Tonnerre, JM Raoux, D Ortega, L Bontempi, E Munzenberg, M Felsch, W Suzuki, M Maruyama, H Durr, HA Dudzik, E van der Laan, G
Citation: N. Jaouen et al., Ce 5d and Fe 3d magnetic profiles in CeH2/Fe multilayers probed by XRMS, APPL PHYS A, 73(6), 2001, pp. 711-715
Surface reactivity of nanostructured tin oxide and Pt-doped tin oxide as studied by EPR and XPS spectroscopies
Authors: Morazzoni, F Canevali, C Chiodini, N Mari, C Ruffo, R Scotti, R Armelao, L Tondello, E Depero, L Bontempi, E
Citation: F. Morazzoni et al., Surface reactivity of nanostructured tin oxide and Pt-doped tin oxide as studied by EPR and XPS spectroscopies, MAT SCI E C, 15(1-2), 2001, pp. 167-169
Structural characterization of tin and molybdenum oxides thin films deposited by RGTO
Authors: Bontempi, E Zampiceni, E Sberveglieri, G Depero, LE
Citation: E. Bontempi et al., Structural characterization of tin and molybdenum oxides thin films deposited by RGTO, CHEM MATER, 13(8), 2001, pp. 2608-2612
Nanostructured Pt-doped tin oxide films: Sol-gel preparation, spectroscopic and electrical characterization
Authors: Morazzoni, F Canevali, C Chiodini, N Mari, C Ruffo, R Scotti, R Armelao, L Tondello, E Depero, LE Bontempi, E
Citation: F. Morazzoni et al., Nanostructured Pt-doped tin oxide films: Sol-gel preparation, spectroscopic and electrical characterization, CHEM MATER, 13(11), 2001, pp. 4355-4361
X-ray reflectivity spectra of ultrathin films and nanometric multilayers: Experiment and simulation
Authors: Bontempi, E Depero, LE Sangaletti, L Giorgis, F Pirri, CF
Citation: E. Bontempi et al., X-ray reflectivity spectra of ultrathin films and nanometric multilayers: Experiment and simulation, J MATER RES, 16(9), 2001, pp. 2556-2561
Effects of plasma non-homogeneity on the physical properties of sputtered thin films
Authors: Rigato, V Maggioni, G Patelli, A Antoni, V Serianni, G Spolaore, M Tramontin, L Depero, L Bontempi, E
Citation: V. Rigato et al., Effects of plasma non-homogeneity on the physical properties of sputtered thin films, SURF COAT, 142, 2001, pp. 943-949
Micro X-ray diffraction on capillary powder samples: a novel and effectivetechnique for overcoming preferred orientation
Authors: Bergese, P Bontempi, E Colombo, I Depero, LE
Citation: P. Bergese et al., Micro X-ray diffraction on capillary powder samples: a novel and effectivetechnique for overcoming preferred orientation, J APPL CRYS, 34, 2001, pp. 663-665
X-ray reflectivity study of the structural properties of SiO2 and SiOF thin films
Authors: Ceriola, G Iacona, F La Via, F Raineri, V Bontempi, E Depero, LE
Citation: G. Ceriola et al., X-ray reflectivity study of the structural properties of SiO2 and SiOF thin films, J ELCHEM SO, 148(12), 2001, pp. F221-F226
X-ray reflectivity and glancing-incidence diffraction from thin metallic Cr layers
Authors: Bontempi, E Depero, LE Sanagaletti, L
Citation: E. Bontempi et al., X-ray reflectivity and glancing-incidence diffraction from thin metallic Cr layers, PHIL MAG B, 80(4), 2000, pp. 623-633
Chemical and magnetization profile study of Ce in [CeLaCe/Fe] and [LaCeLa/Fe] multilayers by resonant X-ray reflectivity
Authors: Jaouen, N Tonnerre, JM Bontempi, E Raoux, D Seve, L Bartolome, F Rogalev, A Muenzenberg, M Felsch, W Durr, HA Dudzik, E Maruyama, H
Citation: N. Jaouen et al., Chemical and magnetization profile study of Ce in [CeLaCe/Fe] and [LaCeLa/Fe] multilayers by resonant X-ray reflectivity, PHYSICA B, 283(1-3), 2000, pp. 175-179
Morphology and microstructural properties of TiO2 nanopowders doped with trivalent Al and Ga cations
Authors: Depero, LE Marino, A Allieri, B Bontempi, E Sangaletti, L Casale, C Notaro, M
Citation: Le. Depero et al., Morphology and microstructural properties of TiO2 nanopowders doped with trivalent Al and Ga cations, J MATER RES, 15(10), 2000, pp. 2080-2086
X-ray resonant magnetic scattering: Application to thin films and multilayers
Authors: Raoux, D Jaouen, N Tonnerre, JM Bontempi, E
Citation: D. Raoux et al., X-ray resonant magnetic scattering: Application to thin films and multilayers, ACT PHY P A, 98(5), 2000, pp. 483-494
Growth process analysis of a-Si1-xNx : H films probed by X-ray reflectivity
Authors: Bontempi, E Depero, LE Sangaletti, L Giorgis, F Pirri, CF
Citation: E. Bontempi et al., Growth process analysis of a-Si1-xNx : H films probed by X-ray reflectivity, MATER CH PH, 66(2-3), 2000, pp. 172-176
Ion beam analysis and Raman characterisation of coatings deposited by cosputtering carbon and chromium in a closed field unbalanced magnetron sputterion plating system
Authors: Rigato, V Maggioni, G Boscarino, D Mariotto, G Bontempi, E Jones, AHS Camino, D Teer, D Santini, C
Citation: V. Rigato et al., Ion beam analysis and Raman characterisation of coatings deposited by cosputtering carbon and chromium in a closed field unbalanced magnetron sputterion plating system, SURF COAT, 119, 1999, pp. 580-584
A new modelling approach to superconductor layered structures
Authors: Depero, LE Sangaletti, L Allieri, B Bontempi, E
Citation: Le. Depero et al., A new modelling approach to superconductor layered structures, SOL ST COMM, 110(7), 1999, pp. 387-392
Growth of WO3 crystals from W-Ti-O thin films
Authors: Sangaletti, L Depero, LE Sberveglieri, G Allieri, B Bontempi, E Groppelli, S
Citation: L. Sangaletti et al., Growth of WO3 crystals from W-Ti-O thin films, J CRYST GR, 199, 1999, pp. 1240-1244
Correlation between crystallite sizes and microstrains in TiO2 nanopowders
Authors: Depero, LE Sangaletti, L Allieri, B Bontempi, E Marino, A Zocchi, M
Citation: Le. Depero et al., Correlation between crystallite sizes and microstrains in TiO2 nanopowders, J CRYST GR, 199, 1999, pp. 516-520
Risultati: 1-17 |