Authors: Toal, V Martin, S Burden, A Bowe, B

Citation: V. Toal et al., Non-destructive testing using electronic speckle pattern interferometry, INSIGHT, 41(3), 1999, pp. 135-141

Authors: Bowe, B Martin, S Toal, V Langhoff, A Whelan, M

Citation: B. Bowe et al., Dual in-plane electronic speckle pattern interferometry system with electro-optical switching and phase shifting, APPL OPTICS, 38(4), 1999, pp. 666-673