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Results:
1-8
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Results: 8
Authors:
Verda, RD
Tesmer, JR
Maggiore, CJ
Nastasi, M
Bower, RW
Citation: Rd. Verda et al., Geometric considerations relevant to hydrogen depth profiling by reflection elastic recoil detection analysis, NUCL INST B, 183(3-4), 2001, pp. 391-400
Authors:
Verda, RD
Maggiore, CJ
Tesmer, JR
Misra, A
Hoechbauer, T
Nastasi, M
Bower, RW
Citation: Rd. Verda et al., Depth profiling of hydrogen in crystalline silicon using elastic recoil detection analysis, NUCL INST B, 183(3-4), 2001, pp. 401-412
Authors:
Li, YA
Bower, RW
Citation: Ya. Li et Rw. Bower, Source roughness of hydrogen ion cut low temperature bonded thin film layers, JPN J A P 1, 39(1), 2000, pp. 275-276
Authors:
Vossough, KK
Bower, RW
Citation: Kk. Vossough et Rw. Bower, Electron field emission from polycrystalline silicon tips, J VAC SCI B, 18(2), 2000, pp. 962-967
Authors:
Hochbauer, T
Walter, KC
Schwarz, RB
Nastasi, M
Bower, RW
Ensinger, W
Citation: T. Hochbauer et al., The influence of boron ion implantation on hydrogen blister formation in n-type silicon, J APPL PHYS, 86(8), 1999, pp. 4176-4183
Authors:
Hong, LN
Bower, RW
Citation: Ln. Hong et Rw. Bower, Radius of curvature considerations for direct wafer bonding, JPN J A P 1, 37(11), 1998, pp. 5932-5936
Authors:
Colinge, JP
Bower, RW
Citation: Jp. Colinge et Rw. Bower, Silicon-on-insulator technology, MRS BULL, 23(12), 1998, pp. 13-15
Authors:
Tong, QY
Bower, RW
Citation: Qy. Tong et Rw. Bower, Beyond "Smart-Cut (R)": Recent advances in layer transfer for material integration, MRS BULL, 23(12), 1998, pp. 40-44
Risultati:
1-8
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