Authors:
Verda, RD
Maggiore, CJ
Tesmer, JR
Misra, A
Hoechbauer, T
Nastasi, M
Bower, RW
Citation: Rd. Verda et al., Depth profiling of hydrogen in crystalline silicon using elastic recoil detection analysis, NUCL INST B, 183(3-4), 2001, pp. 401-412
Authors:
Hochbauer, T
Walter, KC
Schwarz, RB
Nastasi, M
Bower, RW
Ensinger, W
Citation: T. Hochbauer et al., The influence of boron ion implantation on hydrogen blister formation in n-type silicon, J APPL PHYS, 86(8), 1999, pp. 4176-4183