Authors: Boxberg, F Tulkki, J

Citation: F. Boxberg et J. Tulkki, Modeling of oxidation-induced strain and its effect on the electronic properties of Si waveguides, IEEE DEVICE, 48(10), 2001, pp. 2405-2409

Authors: Boxberg, F Virkkala, R Tulkki, J

Citation: F. Boxberg et al., Strain distribution and carrier confinement in Si/SiO2 quantum point contacts and wires, J APPL PHYS, 88(1), 2000, pp. 600-602