Authors: Kregsamer, P Streli, C Wobrauschek, P Gatterbauer, H Pianetta, P Palmetshofer, L Brehm, LL

Citation: P. Kregsamer et al., Synchrotron radiation-excited glancing incidence XRF for depth profile andthin-film analysis of light elements, X-RAY SPECT, 28(4), 1999, pp. 292-296