Authors:
Schermer, S
Jurica, L
Paumard, J
Beinrohr, E
Matysik, FM
Broekaert, JAC
Citation: S. Schermer et al., Optimization of electrochemical hydride generation in a miniaturized electrolytic flow cell coupled to microwave-induced plasma atomic emission spectrometry for the determination of selenium, FRESEN J AN, 371(6), 2001, pp. 740-745
Citation: Mc. Wende et Jac. Broekaert, Investigations on the use of chemical modifiers for the direct determination of trace impurities in Al2O3 ceramic powders by slurry electrothermal evaporation coupled with inductively-coupled plasma mass spectrometry (ETV-ICP-MS), FRESEN J AN, 370(5), 2001, pp. 513-520
Citation: M. Seelig et Jac. Broekaert, Investigations on the on-line determination of metals in air flows by capacitively coupled microwave plasma atomic emission spectrometry, SPECT ACT B, 56(9), 2001, pp. 1747-1760
Authors:
Breer, C
Engel, U
Klostermeier, A
Buscher, W
Broekaert, JAC
Cammann, K
Citation: C. Breer et al., Enclosed inductively coupled plasma: Spatially resolved profiles of rotational temperatures and analyte atom distribution, APPL SPECTR, 55(11), 2001, pp. 1462-1468
Authors:
Kehden, A
Flock, J
Vogel, W
Broekaert, JAC
Citation: A. Kehden et al., Direct solids atomic emission spectrometric analysis of metal samples by "laser-Induced argon spark ablation" coupled to ICP-OES, APPL SPECTR, 55(10), 2001, pp. 1291-1296
Citation: E. Vassileva et al., Determination of arsenic and selenium species in groundwater and soil extracts by ion chromatography coupled to inductively coupled plasma mass spectrometry, ANALYT CHIM, 441(1), 2001, pp. 135-146
Authors:
Bilgic, AM
Engel, U
Voges, E
Kuckelheim, M
Broekaert, JAC
Citation: Am. Bilgic et al., A new low-power microwave plasma source using microstrip technology for atomic emission spectrometry, PLASMA SOUR, 9(1), 2000, pp. 1-4
Citation: J. Reisel et al., Determination of AlN and Al2O3 in steels by electrolytic separation and wavelength dispersive X-ray fluorescence spectrometry, FRESEN J AN, 368(4), 2000, pp. 350-357
Citation: R. Nehm et Jac. Broekaert, Noise power spectra and recovery rates obtained with different nebulizer systems in ICP atomic emission spectrometric analyses in the case of different types of salts and salt contents, FRESEN J AN, 368(2-3), 2000, pp. 156-161
Citation: Jac. Broekaert, Mass spectrometry with plasma sources at atmospheric pressure - state-of-the-art and some developmental trends, FRESEN J AN, 368(1), 2000, pp. 15-22
Authors:
Jurica, L
Manova, A
Dzurov, J
Beinrohr, E
Broekaert, JAC
Citation: L. Jurica et al., Calibrationless flow-through stripping coulometric determination of arsenic(III) and total arsenic in contaminated water samples after microwave assisted reduction of arsenic(V), FRESEN J AN, 366(3), 2000, pp. 260-266
Authors:
Fuchtjohann, L
Jakubowski, N
Gladtke, D
Barnowski, C
Klockow, D
Broekaert, JAC
Citation: L. Fuchtjohann et al., Determination of soluble and insoluble nickel compounds in airborne particulate matter by graphite furnace atomic absorption spectrometry and inductively coupled plasma mass spectrometry, FRESEN J AN, 366(2), 2000, pp. 142-145
Citation: Jp. Guzowski et al., Electrothermal vaporization for sample introduction into a gas sampling glow discharge time-of-flight mass spectrometer, SPECT ACT B, 55(8), 2000, pp. 1295-1314
Citation: Jac. Broekaert, State-of-the-art and trends of development in analytical atomic spectrometry with inductively coupled plasmas as radiation and ion sources, SPECT ACT B, 55(7), 2000, pp. 739-751
Authors:
Bilgic, AM
Voges, E
Engel, U
Broekaert, JAC
Citation: Am. Bilgic et al., A low-power 2.45 GHz microwave induced helium plasma source at atmosphericpressure based on microstrip technology, J ANAL ATOM, 15(6), 2000, pp. 579-580
Authors:
Baude, S
Broekaert, JAC
Delfosse, D
Jakubowski, N
Fuechtjohann, L
Orellana-Velado, NG
Pereiro, R
Sanz-Medel, A
Citation: S. Baude et al., Glow discharge atomic spectrometry for the analysis of environmental samples - a review, J ANAL ATOM, 15(11), 2000, pp. 1516-1525
Authors:
Klare, M
Scheen, J
Vogelsang, K
Jacobs, H
Broekaert, JAC
Citation: M. Klare et al., Degradation of short-chain alkyl- and alkanolamines by TiO2- and Pt/TiO2-assisted photocatalysis, CHEMOSPHERE, 41(3), 2000, pp. 353-362
Citation: F. Herwig et Jac. Broekaert, Optimization of a direct sample insertion into a stabilized capacitive plasma for optical emission spectrometry (SCP-OES), MIKROCH ACT, 134(1-2), 2000, pp. 51-56
Citation: D. Geilenberg et al., Determination of the stoichiometric composition of high-temperature superconductors by ICP-OES for production control, MIKROCH ACT, 133(1-4), 2000, pp. 319-323
Citation: K. Russe et al., Determination of main and minor components of silicon based materials by acombustion with elemental fluorine. Separation of gaseous fluorination products by carrier gas distillation and gas mass spectrometry, ANALYT CHEM, 72(16), 2000, pp. 3875-3880
Authors:
Engel, U
Bilgic, AM
Haase, O
Voges, E
Broekaert, JAC
Citation: U. Engel et al., A microwave-induced plasma based on microstrip technology and its use for the atomic emission spectrometric determination of mercury with the aid of the cold-vapor technique, ANALYT CHEM, 72(1), 2000, pp. 193-197
Authors:
Beinrohr, E
Cakrt, M
Dzurov, J
Jurica, L
Broekaert, JAC
Citation: E. Beinrohr et al., Simultaneous calibrationless determination of zinc, cadmium, lead, and copper by flow-through stripping chronopotentiometry, ELECTROANAL, 11(15), 1999, pp. 1137-1144
Citation: H. Nickel et Jac. Broekaert, Some topical applications of plasma atomic spectrochemical methods for theanalysis of ceramic powders, FRESEN J AN, 363(2), 1999, pp. 145-155
Authors:
Prokisch, C
Bilgic, AM
Voges, E
Broekaert, JAC
Jonkers, J
van Sande, M
van der Mullen, JAM
Citation: C. Prokisch et al., Photographic plasma images and electron number density as well as electrontemperature mappings of a plasma sustained with a modified argon microwaveplasma torch (MPT) measured by spatially resolved Thomson scattering, SPECT ACT B, 54(9), 1999, pp. 1253-1266