Authors: Vernon-Parry, KD Abd-El-Rahman, KF Brough, I Evans-Freeman, JH Zhang, J Peaker, AR

Citation: Kd. Vernon-parry et al., The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures, MAT SC S PR, 4(1-3), 2001, pp. 121-123

Authors: Humphreys, FJ Huang, Y Brough, I Harris, C

Citation: Fj. Humphreys et al., Electron backscatter diffraction of grain and subgrain structures - resolution considerations, J MICROSC O, 195, 1999, pp. 212-216

Authors: Humphreys, FJ Brough, I

Citation: Fj. Humphreys et I. Brough, High resolution electron backscatter diffraction with a field emission gunscanning electron microscope, J MICROSC O, 195, 1999, pp. 6-9