Authors: Reimers, W Pyzalla, A Broda, M Brusch, G Dantz, D Schmackers, T Liss, KD Tschentscher, T

Citation: W. Reimers et al., The use of high-energy synchrotron diffraction for residual stress analyses, J MAT SCI L, 18(7), 1999, pp. 581-583

Authors: Reimers, W Broda, M Brusch, G Dantz, D Liss, KD Pyzalla, A Schmackers, T Tschentscher, T

Citation: W. Reimers et al., Evaluation of residual stresses in the bulk of materials by high energy synchrotron diffraction, J NOND EVAL, 17(3), 1998, pp. 129-140