Citation: Gh. Buh et al., Electrical characterization of an operating Si pn-junction diode with scanning capacitance microscopy and Kelvin probe force microscopy, J APPL PHYS, 90(1), 2001, pp. 443-448
Citation: Gh. Buh et al., Real-time evolution of trapped charge in a SiO2 layer: An electrostatic force microscopy study, APPL PHYS L, 79(13), 2001, pp. 2010-2012
Authors:
Buh, GH
Chung, HJ
Kim, CK
Yi, JH
Yoon, IT
Kuk, Y
Citation: Gh. Buh et al., Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy, APPL PHYS L, 77(1), 2000, pp. 106-108