Authors:
Schreckenbach, JP
Butte, D
Marx, G
Johnson, BR
Kriven, WM
Citation: Jp. Schreckenbach et al., Electrosynthesis and microstructural characterization of anodic Vo(x) films (vol 15, pg 1483, 2000), J MATER RES, 15(8), 2000, pp. 1849-1849
Authors:
Schreckenbach, JP
Witke, K
Butte, D
Marx, G
Citation: Jp. Schreckenbach et al., Characterization of thin metastable vanadium oxide films by Raman spectroscopy, FRESEN J AN, 363(2), 1999, pp. 211-214