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Results: 1-9 |
Results: 9
Zeolitic tuffs as raw materials for lightweight aggregates
Authors: de'GENNARO R CAPPELLETTI P CERRI G de'GENNARO M DONDI M LANGELLA A
Citation: R. De'Gennaro et al., Zeolitic tuffs as raw materials for lightweight aggregates, Applied clay science , 25(1-2), 2004, pp. 71-81
Campanian ignimbrite as raw material for lightweight aggregates
Authors: DE GENNARO R CAPPELLETTI P CERRI G DE GENNARO M DONDI M GRAZIANO S F LANGELLA A
Citation: R. De Gennaro et al., Campanian ignimbrite as raw material for lightweight aggregates, Applied clay science , 37(1-2), 2007, pp. 115-126
Neapolitan yellow tuff as raw material for lightweight aggregates in lightweight structural concrete production
Authors: DE GENNARO R CAPPELLETTI P CERRI G DE GENNARO M DONDI M LANGELLA A
Citation: R. De Gennaro et al., Neapolitan yellow tuff as raw material for lightweight aggregates in lightweight structural concrete production, Applied clay science , 28(1-4), 2005, pp. 309-319
FLASH MEMORY RELIABILITY
Authors: CAPPELLETTI P
Citation: P. Cappelletti, FLASH MEMORY RELIABILITY, Microelectronics and reliability, 38(2), 1998, pp. 185-188
CAST - AN ELECTRICAL STRESS TEST TO MONITOR SINGLE-BIT FAILURES IN FLASH-EEPROM STRUCTURES
Authors: CAPPELLETTI P BEZ R CANTARELLI D NAHMAD D RAVAZZI L
Citation: P. Cappelletti et al., CAST - AN ELECTRICAL STRESS TEST TO MONITOR SINGLE-BIT FAILURES IN FLASH-EEPROM STRUCTURES, Microelectronics and reliability, 37(3), 1997, pp. 473-481
APPLICATION OF ADVANCED ION-IMPLANTATION TECHNIQUES TO FLASH MEMORIES
Authors: CAPPELLETTI P FRATIN L RAVAZZI L
Citation: P. Cappelletti et al., APPLICATION OF ADVANCED ION-IMPLANTATION TECHNIQUES TO FLASH MEMORIES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 405-410
EVALUATION OF MOST FREQUENT ERRORS IN DAILY COMPILATION AND USE OF A RADIATION TREATMENT CHART
Authors: VALLI MC PRINA M BOSSI A CAZZANIGA LF COSENTINO D SCANDOLARO L OSTINELLI A MONTI A CAPPELLETTI P
Citation: Mc. Valli et al., EVALUATION OF MOST FREQUENT ERRORS IN DAILY COMPILATION AND USE OF A RADIATION TREATMENT CHART, Radiotherapy and oncology, 32(1), 1994, pp. 87-89
MULTICENTER EVALUATION OF THE BAYER DAX SYSTEM
Authors: MOROSINI L ROSSETTI M BERTI P PALLOTTI G FABBRI V MAMBELLI MC FRANCESCHIN A DELLANNA L CAPPELLETTI P BROCCO G ZATTI M TARENGHI G FUMAGALLI A
Citation: L. Morosini et al., MULTICENTER EVALUATION OF THE BAYER DAX SYSTEM, European journal of clinical chemistry and clinical biochemistry, 31(12), 1993, pp. 875-896
WAFER LEVEL TUNNEL OXIDE RELIABILITY EVALUATION BY MEANS OF THE EXPONENTIALLY RAMPED CURRENT STRESS METHOD
Authors: CAPPELLETTI P GHEZZI P PIO F RIVA C
Citation: P. Cappelletti et al., WAFER LEVEL TUNNEL OXIDE RELIABILITY EVALUATION BY MEANS OF THE EXPONENTIALLY RAMPED CURRENT STRESS METHOD, Microelectronics and reliability, 33(10), 1993, pp. 1579-1596
Risultati: 1-9 |