Citation: A. Kebbede et Ah. Carim, INFLUENCE OF PROCESS VARIATIONS ON MICROSTRUCTURE IN DOPED SOL-GEL DERIVED ALPHA-ALUMINA, Materials letters, 36(1-4), 1998, pp. 109-113
Citation: Ah. Carim et Ch. Mohr, BRAZING OF ALUMINA WITH TI4CU2O AND TI3CU3O INTERLAYERS (VOL 33, PG 195, 1997), Materials letters, 34(3-6), 1998, pp. 435-435
Citation: Js. Kephart et Ah. Carim, TERNARY COMPOUNDS AND PHASE-EQUILIBRIA IN TI-GE-C AND TI-GE-B, Journal of the Electrochemical Society, 145(9), 1998, pp. 3253-3258
Citation: A. Kebbede et al., GRAIN-BOUNDARIES IN TITANIA-DOPED ALPHA-ALUMINA WITH ANISOTROPIC MICROSTRUCTURE, Journal of the American Ceramic Society, 80(11), 1997, pp. 2814-2820
Authors:
CARIM AH
ROHRER GS
DANDO NR
TZENG SY
ROHRER CL
PERROTTA AJ
Citation: Ah. Carim et al., CONVERSION OF DIASPORE TO CORUNDUM - A NEW ALPHA-ALUMINA TRANSFORMATION SEQUENCE, Journal of the American Ceramic Society, 80(10), 1997, pp. 2677-2680
Citation: Gp. Kelkar et Ah. Carim, PHASE-EQUILIBRIA IN THE TI-AL-O SYSTEM AT 945-DEGREES-C AND ANALYSIS OF TI AL2O3 REACTIONS/, Journal of the American Ceramic Society, 78(3), 1995, pp. 572-576
Citation: Gp. Kelkar et al., THERMODYNAMIC EVALUATION OF REACTION-PRODUCTS AND LAYERING IN BRAZED ALUMINA JOINTS, Journal of materials research, 9(9), 1994, pp. 2244-2250
Authors:
SKOFRONICK GL
CARIM AH
FOLTYN SR
MUENSCHAUSEN RE
Citation: Gl. Skofronick et al., ORIENTATION OF YBA2CU3O7-X FILMS ON UNBUFFERED AND CEO2-BUFFERED YTTRIA-STABILIZED ZIRCONIA SUBSTRATES, Journal of applied physics, 76(8), 1994, pp. 4753-4760
Citation: S. Troliermckinstry et al., SPECTROSCOPIC ELLIPSOMETRY INVESTIGATION OF AMORPHOUS-SILICON NITRIDETHIN-FILMS, Journal of the Electrochemical Society, 141(9), 1994, pp. 2483-2486
Authors:
SKOFRONICK GL
CARIM AH
FOLTYN SR
MUENCHAUSEN RE
Citation: Gl. Skofronick et al., INTERFACIAL REACTION-PRODUCTS AND FILM ORIENTATION IN YBA2CU3O7-X ON ZIRCONIA SUBSTRATES WITH AND WITHOUT CEO2 BUFFER LAYERS, Journal of materials research, 8(11), 1993, pp. 2785-2798
Citation: Ah. Carim et Te. Mitchell, 90-DEGREES BOUNDARIES AND ASSOCIATED INTERFACIAL AND STAND-OFF PARTIAL DISLOCATIONS IN YBA2CU3O7-X, Ultramicroscopy, 51(1-4), 1993, pp. 228-238
Citation: Hg. Hu et Ah. Carim, DETERMINATION OF ATTENUATION LENGTHS AND ELECTRON-ESCAPE DEPTHS IN SILICON-NITRIDE THIN-FILMS, Journal of the Electrochemical Society, 140(11), 1993, pp. 3203-3209
Citation: Gp. Kelkar et Ah. Carim, SYNTHESIS, PROPERTIES, AND TERNARY PHASE-STABILITY OF M6X COMPOUNDS IN THE TI-CU-O SYSTEM, Journal of the American Ceramic Society, 76(7), 1993, pp. 1815-1820