Authors: MUNKHOLM A BRENNAN S CARR EC

Citation: A. Munkholm et al., A COMPARISON OF SURFACE-ROUGHNESS AS MEASURED BY ATOMIC-FORCE MICROSCOPY AND X-RAY-SCATTERING, Journal of applied physics, 82(6), 1997, pp. 2944-2953

Authors: KAMINS TI CARR EC WILLIAMS RS ROSNER SJ

Citation: Ti. Kamins et al., DEPOSITION OF 3-DIMENSIONAL GE ISLANDS ON SI(001) BY CHEMICAL-VAPOR-DEPOSITION AT ATMOSPHERIC AND REDUCED PRESSURES, Journal of applied physics, 81(1), 1997, pp. 211-219

Authors: ROSNER SJ CARR EC LUDOWISE MJ GIROLAMI G ERIKSON HI

Citation: Sj. Rosner et al., CORRELATION OF CATHODOLUMINESCENCE INHOMOGENEITY WITH MICROSTRUCTURALDEFECTS IN EPITAXIAL GAN GROWN BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Applied physics letters, 70(4), 1997, pp. 420-422

Authors: CARR EC ELLIS KA BUHRMAN RA

Citation: Ec. Carr et al., N-DEPTH PROFILES IN THIN SIO2 GROWN OR PROCESSED IN N2O - THE ROLE OFATOMIC OXYGEN, Applied physics letters, 66(12), 1995, pp. 1492-1494

Authors: KWAN JTC CARR EC BARRON JL BENDING MR

Citation: Jtc. Kwan et al., CARBAMYLATED HEMOGLOBIN - A RETROSPECTIVE INDEX OF TIME-AVERAGED UREACONCENTRATION, Nephrology, dialysis, transplantation, 8(6), 1993, pp. 565-567

Authors: CARR EC BUHRMAN RA

Citation: Ec. Carr et Ra. Buhrman, ROLE OF INTERFACIAL NITROGEN IN IMPROVING THIN SILICON-OXIDES GROWN IN N2O, Applied physics letters, 63(1), 1993, pp. 54-56