Citation: Am. Salvia et Je. Castle, THE INTRINSIC ASYMMETRY OF PHOTOELECTRON PEAKS - DEPENDENCE ON CHEMICAL-STATE AND ROLE IN CURVE-FITTING, Journal of electron spectroscopy and related phenomena, 95(1), 1998, pp. 45-56
Citation: Am. Salvi et Je. Castle, THE INTRINSIC ASYMMETRY COMPONENT OF THE TOTAL BACKGROUND IN XP SPECTRA, Journal of electron spectroscopy and related phenomena, 94(1-2), 1998, pp. 73-87
Citation: Pa. Zhdan et al., IN-SITU SCANNING FORCE MICROSCOPY (SFM) STUDY OF THE ELECTROCHEMICAL ACTIVATIONS OF CARBON-FIBERS, Composites science and technology, 58(3-4), 1998, pp. 559-570
Citation: Je. Castle et Pa. Zhdan, CHARACTERIZATION OF SURFACE-TOPOGRAPHY BY SEM AND SFM - PROBLEMS AND SOLUTIONS, Journal of physics. D, Applied physics, 30(5), 1997, pp. 722-740
Authors:
ZHANG JP
HEMMENT PLF
CASTLE JE
LIU HD
WATTS JF
KUBIAK RA
NEWSTEAD SM
WHALL TE
PARKER EHC
Citation: Jp. Zhang et al., THERMODYNAMIC BEHAVIOR OF GEO2 FORMED BY OXYGEN IMPLANTATION INTO RELAXED SI0.5GE0.5 ALLOY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 281-285
Citation: Je. Castle et S. Feliu, A STUDY OF THE ABRASIVE WEAR IN THE POLISHING OF POLYPROPYLENE USING X-RAY PHOTOELECTRON-SPECTROSCOPY, Journal of Materials Science, 30(5), 1995, pp. 1151-1157
Citation: Pa. Zhdan et al., SURFACE-STRUCTURE OF THE PAN-BASED CARBON-FIBERS STUDIED BY THE SCANNING PROBE MICROSCOPY (SPM), Surface and interface analysis, 22(1-12), 1994, pp. 290-295
Citation: Mp. Seah et al., SIMPLE METHOD OF DEPTH PROFILING (STRATIFYING) CONTAMINATION LAYERS, ILLUSTRATED BY STUDIES ON STAINLESS-STEEL, Surface and interface analysis, 21(6-7), 1994, pp. 336-341
Citation: Sn. Jenkins et Je. Castle, DEVELOPMENT AND PRACTICAL APPLICATION OF A TRANSMISSION-X-RAY PHOTOELECTRON SPECTROMETER, Surface and interface analysis, 21(6-7), 1994, pp. 382
Citation: Mp. Seah et al., STABILITY OF REFERENCE MASSES-II - THE EFFECT OF ENVIRONMENT AND CLEANING METHODS ON THE SURFACES OF STAINLESS-STEEL AND ALLIED MATERIALS, Metrologia, 31(2), 1994, pp. 93-108
Citation: Je. Castle et al., THE USE OF SCANNING AUGER MICROSCOPY TO LOCATE CATHODIC CENTERS IN SICP 6061 AL MMC AND TO DETERMINE THE CURRENT-DENSITY AT WHICH THEY OPERATE/, Corrosion science, 36(6), 1994, pp. 1093
Citation: Ca. Baillie et al., THE INFLUENCE OF CHEMISTRY ON THE ADHESION AT THE INTERFACE OF CARBON-EPOXY COMPOSITES, Composites science and technology, 48(1-4), 1993, pp. 97-102
Citation: Sn. Jenkins et Je. Castle, PRELIMINARY-RESULTS FROM THE DEVELOPMENT OF A TRANSMISSION-X-RAY PHOTOELECTRON SPECTROMETER, Surface and interface analysis, 20(12), 1993, pp. 935