Authors: ZHELUDEVA SI KOVALCHUK MV NOVIKOVA NN SOSPHENOV AN MALYSHEVA NE SALASHENKO NN AKHSAKHALYAN AD PLATONOV YY CERNIK RI COLLINS SP

Citation: Si. Zheludeva et al., NEW METHOD OF ULTRA-THIN FILM CHARACTERIZATION APPLIED TO THE INVESTIGATION OF C NI/C STRUCTURES UNDER HEAT LOAD/, Thin solid films, 259(2), 1995, pp. 131-138