Authors: VANOLMEN J DECEUNINCK W DESCHEPPER L GOLDONI A CERVINI A FANTINI F

Citation: J. Vanolmen et al., THE THERMALLY BALANCED BRIDGE TECHNIQUE (TBBT) - A NEW HIGH-RESOLUTION RESISTOMETRIC MEASUREMENT TECHNIQUE FOR THE STUDY OF ELECTROMIGRATION-INDUCED EARLY RESISTANCE CHANGES IN METAL STRIPES, Microelectronics and reliability, 37(10-11), 1997, pp. 1483-1486