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Results: 1-25/49
Authors:
BOUNASRI F
PELLETIER J
MOISAN M
CHAKER M
Citation: F. Bounasri et al., SURFACE-DIFFUSION MODEL ACCOUNTING FOR THE TEMPERATURE-DEPENDENCE OF TUNGSTEN ETCHING CHARACTERISTICS IN A SF6 MAGNETOPLASMA, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1068-1076
Authors:
MEREL P
TABBAL M
CHAKER M
MOISAN M
RICARD A
Citation: P. Merel et al., INFLUENCE OF THE FIELD FREQUENCY ON THE NITROGEN ATOM YIELD IN THE REMOTE PLASMA OF AN N-2 HIGH-FREQUENCY DISCHARGE, Plasma sources science & technology (Print), 7(4), 1998, pp. 550-556
Authors:
STONGE L
MARGOT J
CHAKER M
Citation: L. Stonge et al., EXPERIMENTAL INVESTIGATION OF A LARGE-VOLUME SF6 MAGNETOPLASMA SOURCEBASED ON SURFACE-WAVE PROPAGATION, Plasma sources science & technology, 7(2), 1998, pp. 154-161
Authors:
ELKHAKANI MA
CHAKER M
LEDROGOFF B
Citation: Ma. Elkhakani et al., IRIDIUM THIN-FILMS DEPOSITED BY RADIOFREQUENCY MAGNETRON SPUTTERING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(2), 1998, pp. 885-888
Authors:
TABBAL M
MEREL P
MOISA S
CHAKER M
GAT E
RICARD A
MOISAN M
GUJRATHI S
Citation: M. Tabbal et al., XPS AND FTIR ANALYSIS OF NITROGEN INCORPORATION IN CNX THIN-FILMS, Surface & coatings technology, 98(1-3), 1998, pp. 1092-1096
Authors:
MEREL P
TABBAL M
CHAKER M
MOISA S
MARGOT J
Citation: P. Merel et al., DIRECT EVALUATION OF THE SP(3) CONTENT IN DIAMOND-LIKE-CARBON FILMS BY XPS, Applied surface science, 136(1-2), 1998, pp. 105-110
Authors:
STONGE L
MARGOT J
CHAKER M
Citation: L. Stonge et al., CHARACTERIZATION OF THE NEGATIVE-ION FRACTION IN HIGH-DENSITY SF6 MAGNETOPLASMAS USING ION-ACOUSTIC-WAVES, Applied physics letters, 72(3), 1998, pp. 290-292
Authors:
MARGOT J
CHAKER M
STONGE L
TABBAL M
ALIOUCHOUCHE A
PAUNA O
ALINOT C
KLIAGINE C
Citation: J. Margot et al., HIGH-FREQUENCY MAGNETOPLASMAS IN ELECTRONEGATIVE GASES, Journal de physique. IV, 7(C4), 1997, pp. 295-305
Authors:
ELKHAKANI MA
CHAKER M
OHERN ME
OLIVER WC
Citation: Ma. Elkhakani et al., LINEAR-DEPENDENCE OF BOTH THE HARDNESS AND THE ELASTIC-MODULUS OF PULSED-LASER DEPOSITED A-SIC FILMS UPON THEIR SI-C BOND DENSITY, Journal of applied physics, 82(9), 1997, pp. 4310-4318
Authors:
PELLETIER JF
CHAKER M
KIEFFER JC
Citation: Jf. Pelletier et al., SOFT-X-RAY EMISSION PRODUCED BY A SUBPICOSECOND LASER IN A SINGLE-PULSE AND DOUBLE-PULSE SCHEME, Journal of applied physics, 81(9), 1997, pp. 5980-5983
Authors:
MEREL P
CHAKER M
TABBAL M
MOISAN M
Citation: P. Merel et al., THE INFLUENCE OF ATOMIC NITROGEN FLUX ON THE COMPOSITION OF CARBON NITRIDE THIN-FILMS, Applied physics letters, 71(26), 1997, pp. 3814-3816
Authors:
BEAUDOIN Y
CHAKER M
JOHNSTON TW
PEPIN H
Citation: Y. Beaudoin et al., LASER REFLECTOMETRY IN-SITU MEASUREMENT OF LEAD-ZIRCONATE-TITANATE FILM GROWTH, Applied optics, 36(3), 1997, pp. 655-657
Authors:
GAT E
BOUNASRI F
CHAKER M
RAVET MF
MOISAN M
MARGOT J
Citation: E. Gat et al., TEMPERATURE EFFECTS ON TUNGSTEN ETCHING, Microelectronic engineering, 30(1-4), 1996, pp. 337-340
Authors:
PELLETIER JF
CHAKER M
KIEFFER JC
Citation: Jf. Pelletier et al., PICOSECOND SOFT-X-RAY PULSES FROM A HIGH-INTENSITY LASER-PLASMA SOURCE, Optics letters, 21(14), 1996, pp. 1040-1042
Authors:
LAFONTAINE H
HAGHIRIGOSNET AM
JIN Y
CROZAT P
ADDE R
CHAKER M
PEPIN H
ROUSSEAUX F
LAUNOIS H
Citation: H. Lafontaine et al., CHARACTERISTICS OF GAAS ALGAAS HEMTS FABRICATED BY X-RAY-LITHOGRAPHY/, I.E.E.E. transactions on electron devices, 43(1), 1996, pp. 175-178
Authors:
PELLETIER JF
CHAKER M
KIEFFER JC
Citation: Jf. Pelletier et al., TARGET ATOMIC-NUMBER EFFECT ON THE DURATION AND CONVERSION EFFICIENCYOF ULTRASHORT X-RAY PULSES, Applied physics letters, 69(15), 1996, pp. 2172-2174
Authors:
ELKHAKANI MA
CHAKER M
GAT E
Citation: Ma. Elkhakani et al., PULSED-LASER DEPOSITION OF HIGHLY CONDUCTIVE IRIDIUM OXIDE THIN-FILMS, Applied physics letters, 69(14), 1996, pp. 2027-2029
Authors:
TABBAL M
MEREL P
MOISA S
CHAKER M
RICARD A
MOISAN M
Citation: M. Tabbal et al., X-RAY PHOTOELECTRON-SPECTROSCOPY OF CARBON NITRIDE FILMS DEPOSITED BYGRAPHITE LASER-ABLATION IN A NITROGEN POSTDISCHARGE, Applied physics letters, 69(12), 1996, pp. 1698-1700
Authors:
MONTCALM C
KEARNEY PA
SLAUGHTER JM
SULLIVAN BT
CHAKER M
PEPIN H
FALCO CM
Citation: C. Montcalm et al., SURVEY OF TI-BASED, B-BASED, AND Y-BASED SOFT X-RAY-EXTREME ULTRAVIOLET MULTILAYER MIRRORS FOR THE 2 TO 12-NM WAVELENGTH REGION, Applied optics, 35(25), 1996, pp. 5134-5147
Authors:
JIANG Z
KIEFFER JC
MATTE JP
CHAKER M
PEYRUSSE O
GILLES D
KORN G
MAKSIMCHUK A
COE S
MOUROU G
Citation: Z. Jiang et al., X-RAY SPECTROSCOPY OF HOT SOLID DENSITY PLASMAS PRODUCED BY SUBPICOSECOND HIGH-CONTRAST LASER-PULSES AT 10(18)-10(19) W CM(2)/, Physics of plasmas, 2(5), 1995, pp. 1702-1711
Authors:
AUGST S
TALEBPOUR A
CHIN SL
BEAUDOIN Y
CHAKER M
Citation: S. Augst et al., NONSEQUENTIAL TRIPLE IONIZATION OF ARGON ATOMS IN A HIGH-INTENSITY LASER FIELD, Physical review. A, 52(2), 1995, pp. 917-919
Authors:
LIANG Y
AUGST S
BEAUDOIN Y
CHAKER M
YU H
BANDRAUK AD
CHIN SL
Citation: Y. Liang et al., INVESTIGATION OF PHOTON-EMISSION SPECTRA OF HYDROGEN USING INTENSE SUBPICOSECOND TI-SAPPHIRE ND-GLASS LASER-PULSES, Journal of physics. B, Atomic molecular and optical physics, 28(16), 1995, pp. 3661-3674
Authors:
CHIN SL
LIANG Y
AUGST S
GOLOVINSKI PA
BEAUDOIN Y
CHAKER M
Citation: Sl. Chin et al., HIGH HARMONIC-GENERATION IN ATOMS AND DIATOMIC-MOLECULES USING ULTRASHORT LASER-PULSES IN THE MULTIPHOTON REGIME, Journal of nonlinear optical physics and materials, 4(3), 1995, pp. 667-686
Authors:
ELKHAKANI MA
GUAY D
CHAKER M
FENG XH
Citation: Ma. Elkhakani et al., COMPOSITION AND THERMAL-ANNEALING-INDUCED SHORT-RANGE ORDERING CHANGES IN AMORPHOUS HYDROGENATED SILICON-CARBIDE FILMS AS INVESTIGATED BY EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE AND INFRARED-ABSORPTION, Physical review. B, Condensed matter, 51(8), 1995, pp. 4903-4914
Authors:
MONTCALM C
SULLIVAN BT
DUGUAY S
RANGER M
STEFFENS W
PEPIN H
CHAKER M
Citation: C. Montcalm et al., IN-SITU REFLECTANCE MEASUREMENTS OF SOFT-X-RAY EXTREME-ULTRAVIOLET MOY MULTILAYER MIRRORS/, Optics letters, 20(12), 1995, pp. 1450-1452