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Results: 2
2-STAGE HOT-CARRIER DEGRADATION AND ITS IMPACT ON SUBMICROMETER LDD NMOSFET LIFETIME PREDICTION
Authors: CHAN VH CHUNG JE
Citation: Vh. Chan et Je. Chung, 2-STAGE HOT-CARRIER DEGRADATION AND ITS IMPACT ON SUBMICROMETER LDD NMOSFET LIFETIME PREDICTION, I.E.E.E. transactions on electron devices, 42(5), 1995, pp. 957-962
THE IMPACT OF NMOSFET HOT-CARRIER DEGRADATION ON CMOS ANALOG SUBCIRCUIT PERFORMANCE
Authors: CHAN VH CHUNG JE
Citation: Vh. Chan et Je. Chung, THE IMPACT OF NMOSFET HOT-CARRIER DEGRADATION ON CMOS ANALOG SUBCIRCUIT PERFORMANCE, IEEE journal of solid-state circuits, 30(6), 1995, pp. 644-649
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