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Citation: J. Lai et al., THERMAL DETECTION OF DEVICE FAILURE BY ATOMIC-FORCE MICROSCOPY, IEEE electron device letters, 16(7), 1995, pp. 312-315

Authors: MAJUMDAR A LAI J CHANDRACHOOD M NAKABEPPU O WU Y SHI Z

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Authors: NAKABEPPU O CHANDRACHOOD M WU Y LAI J MAJUMDAR A

Citation: O. Nakabeppu et al., SCANNING THERMAL IMAGING MICROSCOPY USING COMPOSITE CANTILEVER PROBES, Applied physics letters, 66(6), 1995, pp. 694-696