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Results: 1-12 |
Results: 12
ELECTROLYTE ELECTROREFLECTANCE STUDY OF THE OSCILLATORY HYDROGEN-PEROXIDE REDUCTION ON N-GAAS
Authors: KOPER MTM CHAPARRO AM TRIBUTSCH H VANMAEKELBERGH D
Citation: Mtm. Koper et al., ELECTROLYTE ELECTROREFLECTANCE STUDY OF THE OSCILLATORY HYDROGEN-PEROXIDE REDUCTION ON N-GAAS, Langmuir, 14(14), 1998, pp. 3926-3931
THE SCANNING MICROSCOPE FOR SEMICONDUCTOR CHARACTERIZATION - PHOTOCURRENT, PHOTOVOLTAGE AND ELECTROLYTE ELECTROREFLECTANCE IMAGING AT THE N-MOSE2 I- INTERFACE/
Authors: CHAPARRO AM SALVADOR P MIR A
Citation: Am. Chaparro et al., THE SCANNING MICROSCOPE FOR SEMICONDUCTOR CHARACTERIZATION - PHOTOCURRENT, PHOTOVOLTAGE AND ELECTROLYTE ELECTROREFLECTANCE IMAGING AT THE N-MOSE2 I- INTERFACE/, Journal of electroanalytical chemistry [1992], 424(1-2), 1997, pp. 153-157
LOCALIZED PHOTOELECTROCHEMICAL ETCHING WITH MICROMETRIC LATERAL RESOLUTION ON TRANSITION-METAL DISELENIDE PHOTOELECTRODES
Authors: CHAPARRO AM SALVADOR P MIR A
Citation: Am. Chaparro et al., LOCALIZED PHOTOELECTROCHEMICAL ETCHING WITH MICROMETRIC LATERAL RESOLUTION ON TRANSITION-METAL DISELENIDE PHOTOELECTRODES, Journal of electroanalytical chemistry [1992], 422(1-2), 1997, pp. 35-44
MINORITY-CARRIER DYNAMICS AND INTERFACIAL KINETICS AT THE ZNO ELECTROLYTE INTERFACE STUDIED BY COMBINED PHOTOCURRENT/MICROWAVE PHOTOCONDUCTIVITY MEASUREMENTS/
Authors: CHAPARRO AM TRIBUTSCH H
Citation: Am. Chaparro et H. Tributsch, MINORITY-CARRIER DYNAMICS AND INTERFACIAL KINETICS AT THE ZNO ELECTROLYTE INTERFACE STUDIED BY COMBINED PHOTOCURRENT/MICROWAVE PHOTOCONDUCTIVITY MEASUREMENTS/, JOURNAL OF PHYSICAL CHEMISTRY B, 101(38), 1997, pp. 7428-7434
DYNAMICS OF THE OXYGEN-EVOLVING RUS2 ELECTROLYTE INTERFACE - AN ELECTROREFLECTANCE STUDY/
Authors: CHAPARRO AM ALONSOVANTE N SALVADOR P TRIBUTSCH H
Citation: Am. Chaparro et al., DYNAMICS OF THE OXYGEN-EVOLVING RUS2 ELECTROLYTE INTERFACE - AN ELECTROREFLECTANCE STUDY/, Journal of the Electrochemical Society, 144(9), 1997, pp. 2991-2996
THE SCANNING MICROSCOPE FOR SEMICONDUCTOR CHARACTERIZATION (SMSC) - STUDY OF THE INFLUENCE OF SURFACE-MORPHOLOGY ON THE PHOTOELECTROCHEMICAL BEHAVIOR OF AN N-MOSE2 SINGLE-CRYSTAL ELECTRODE BY PHOTOCURRENT AND ELECTROLYTE ELECTROREFLECTANCE IMAGING
Authors: CHAPARRO AM SALVADOR P MIR A
Citation: Am. Chaparro et al., THE SCANNING MICROSCOPE FOR SEMICONDUCTOR CHARACTERIZATION (SMSC) - STUDY OF THE INFLUENCE OF SURFACE-MORPHOLOGY ON THE PHOTOELECTROCHEMICAL BEHAVIOR OF AN N-MOSE2 SINGLE-CRYSTAL ELECTRODE BY PHOTOCURRENT AND ELECTROLYTE ELECTROREFLECTANCE IMAGING, Journal of electroanalytical chemistry [1992], 418(1-2), 1996, pp. 175-183
THE SCANNING MICROSCOPE FOR SEMICONDUCTOR CHARACTERIZATION (SMSC) - COMPARATIVE-STUDY OF THE INFLUENCE OF SURFACE-DEFECTS ON THE PHOTOELECTROCHEMICAL BEHAVIOR OF N-WSE2 AND N-MOSE2 LAYERED COMPOUNDS
Authors: CHAPARRO AM SALVADOR P MIR A
Citation: Am. Chaparro et al., THE SCANNING MICROSCOPE FOR SEMICONDUCTOR CHARACTERIZATION (SMSC) - COMPARATIVE-STUDY OF THE INFLUENCE OF SURFACE-DEFECTS ON THE PHOTOELECTROCHEMICAL BEHAVIOR OF N-WSE2 AND N-MOSE2 LAYERED COMPOUNDS, Journal of electroanalytical chemistry [1992], 411(1-2), 1996, pp. 79-85
DIGITAL IMAGING OF THE EFFECT OF PHOTOETCHING ON THE PHOTORESPONSE OFN-TYPE TUNGSTEN DISELENIDE AND MOLYBDENUM DISELENIDE SINGLE-CRYSTAL ELECTRODES
Authors: SALVADOR P CHAPARRO AM MIR A
Citation: P. Salvador et al., DIGITAL IMAGING OF THE EFFECT OF PHOTOETCHING ON THE PHOTORESPONSE OFN-TYPE TUNGSTEN DISELENIDE AND MOLYBDENUM DISELENIDE SINGLE-CRYSTAL ELECTRODES, Journal of physical chemistry, 100(2), 1996, pp. 760-768
THE ROLE OF SURFACE-DEFECTS IN THE PHOTOOXIDATION OF IODIDE AT N-MOSE2 - EVIDENCE FOR A LOCAL AUTOCATALYTIC EFFECT
Authors: CHAPARRO AM SALVADOR P PETER LM
Citation: Am. Chaparro et al., THE ROLE OF SURFACE-DEFECTS IN THE PHOTOOXIDATION OF IODIDE AT N-MOSE2 - EVIDENCE FOR A LOCAL AUTOCATALYTIC EFFECT, Journal of physical chemistry, 99(17), 1995, pp. 6677-6683
PHOTOELECTROCHEMICAL STUDY OF THE TIO2-CR SYSTEM - OBSERVATION OF STRONG(001) RUTILE PHOTOETCHING IN THE PRESENCE OF CR(VI)
Authors: GONZALEZ MLG CHAPARRO AM SALVADOR P
Citation: Mlg. Gonzalez et al., PHOTOELECTROCHEMICAL STUDY OF THE TIO2-CR SYSTEM - OBSERVATION OF STRONG(001) RUTILE PHOTOETCHING IN THE PRESENCE OF CR(VI), Journal of photochemistry and photobiology. A, Chemistry, 73(3), 1993, pp. 221-231
CHARGE RECOMBINATION IMAGING AT THE WSE2 I- INTERFACE/
Authors: CHAPARRO AM SALVADOR P TABERNERO A NAVARRO R COLL B CASELLES V
Citation: Am. Chaparro et al., CHARGE RECOMBINATION IMAGING AT THE WSE2 I- INTERFACE/, Surface science, 295(3), 1993, pp. 457-461
ELECTROREFLECTANCE ANISOTROPY AT THE WSE2 LAYER SEMICONDUCTOR
Authors: CHAPARRO AM SALVADOR P COLL B GONZALEZ M
Citation: Am. Chaparro et al., ELECTROREFLECTANCE ANISOTROPY AT THE WSE2 LAYER SEMICONDUCTOR, Surface science, 293(3), 1993, pp. 160-164
Risultati: 1-12 |