Citation: Jf. Chen et al., A RIGOROUS STATISTICAL TECHNIQUE FOR INFERRING CIRCULAR SILO WALL PRESSURES FROM WALL STRAIN-MEASUREMENTS, Engineering structures, 18(4), 1996, pp. 321-331
Citation: Yx. Xia et al., SOLUBILITY, DISSOCIATION AND COMPLEXATION WITH ND(III) AND TH(IV) OF OXINE, THENOYLTRIFLUOROACETONE AND 1,10-PHENANTHROLINE IN 5.0 M NACL, Talanta, 43(12), 1996, pp. 2073-2081
Citation: Py. Wang et al., STRUCTURAL AND ELECTRICAL-PROPERTIES OF GASB, ALGASB AND THEIR HETEROSTRUCTURES GROWN ON GAAS BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of crystal growth, 160(3-4), 1996, pp. 241-249
Citation: J. Tao et al., MODELING AND CHARACTERIZATION OF ELECTROMIGRATION FAILURES UNDER BIDIRECTIONAL CURRENT STRESS, I.E.E.E. transactions on electron devices, 43(5), 1996, pp. 800-808
Citation: Th. Cheng et al., LOSS PERFORMANCE OF TAGGED AND NORMAL ATM CELLS AT A PARTIALLY SHAREDBUFFER, Electronics Letters, 32(13), 1996, pp. 1166-1167
Citation: Jf. Chen et Wf. Bogaerts, ELECTROCHEMICAL EMISSION-SPECTROSCOPY FOR MONITORING UNIFORM AND LOCALIZED CORROSION, Corrosion, 52(10), 1996, pp. 753-759
Citation: Jf. Chen et al., INTERACTION OF MACROMIXING AND MICROMIXING ON PARTICLE-SIZE DISTRIBUTION IN REACTIVE PRECIPITATION, Chemical Engineering Science, 51(10), 1996, pp. 1957-1966
Citation: Jf. Chen et al., CHARACTERIZATIONS OF DEEP LEVELS IN SNTE-DOPED GASB BY ADMITTANCE SPECTROSCOPY, Applied physics letters, 69(13), 1996, pp. 1891-1893
Citation: Jf. Chen et al., DERIVATIVE ANALYSIS OF POTENTIOMETRIC TITRATION DATA TO OBTAIN PROTONATION CONSTANTS, Analytical chemistry, 68(22), 1996, pp. 3973-3978
Citation: Jf. Chen et al., EXPERIMENTAL DEMONSTRATION OF THE FREQUENCY-DEPENDENCE OF THE EFFECTIVE SCATTERER NUMBER DENSITY, The Journal of the Acoustical Society of America, 99(4), 1996, pp. 1932-1936
Citation: Jf. Chen et al., ELECTRICAL-PROPERTIES OF UNDOPED AND SNTE-DOPED GAXIN1-XSB MOLECULAR-BEAM-EPITAXIALLY GROWN ON GAAS, JPN J A P 1, 34(1), 1995, pp. 81-82
Citation: Pz. Zhang et al., DELTA-C-13 VALUES AND HYDROGEN INDEX RECORDS IN SEDIMENT ORGANIC-MATTER OF RH CORE OF ZOIGE BASIN, EASTERN QING-ZANG (TIBET) PLATEAU AND THEIR ENVIRONMENTAL SIGNIFICANCE, Science in China. Series B, Chemistry, life sciences & earth sciences, 38(8), 1995, pp. 1015-1024
Citation: Jf. Chen et al., COOLING AGE OF DABIE OROGEN, CHINA, DETERMINED BY AR-40-AR-39 AND FISSION-TRACK TECHNIQUES, Science in China. Series B, Chemistry, life sciences & earth sciences, 38(6), 1995, pp. 749-757
Citation: Jf. Chen et al., STUDY ON THE OPTICAL-PROPERTIES AND HYDROGEN CONTENT OF THE SILICON-NITRIDE THIN-FILM, Acta physica Sinica, 4(9), 1995, pp. 698-704
Citation: Jf. Chen et Cl. Chu, COMBINATION VOLTAGE-CONTROLLED AND CURRENT-CONTROLLED PWM INVERTERS FOR UPS PARALLEL OPERATION, IEEE transactions on power electronics, 10(5), 1995, pp. 547-558
Citation: Jf. Chen et al., ANALYSIS OF AN ADAPTIVE TIME-SERIES AUTOREGRESSIVE MOVING-AVERAGE (ARMA) MODEL FOR SHORT-TERM LOAD FORECASTING, Electric power systems research, 34(3), 1995, pp. 187-196
Citation: Jf. Chen et al., THE UNIQUENESS OF THE LOCAL MINIMUM FOR POWER ECONOMIC-DISPATCH PROBLEMS, Electric power systems research, 32(3), 1995, pp. 187-193
Citation: Jf. Chen et Lj. Chen, TRANSMISSION ELECTRON-MICROSCOPY AND X-RAY-DIFFRACTION INVESTIGATION OF PHASE-FORMATION AND TRANSITION BETWEEN PD2SI AND PDSI IN PD THIN-FILMS ON (111)SI, Materials chemistry and physics, 39(3), 1995, pp. 229-235
Citation: Jf. Chen et al., THERMAL-STABILITY OF TISI2 ON ION-IMPLANTED SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 361-365
Citation: Rj. Fowell et al., SUGGESTED METHOD FOR DETERMINING MODE-I FRACTURE-TOUGHNESS USING CRACKED CHEVRON-NOTCHED BRAZILIAN DISC (CCNBD) SPECIMENS, International journal of rock mechanics and mining sciences & geomechanics abstracts, 32(1), 1995, pp. 57-64
Citation: Jf. Chen et Gr. Choppin, ACTIVITY-COEFFICIENTS OF SINGLE ELECTROLYTES IN CONCENTRATED-SOLUTIONS DERIVED FROM A QUASI-LATTICE MODEL, Journal of solution chemistry, 24(5), 1995, pp. 465-484
Citation: Jf. Chen et Lj. Chen, XEPITAXIAL-GROWTH AND THERMAL-STABILITY OF THIN PD2SI FILMS ON (001)SI, (011)SI AND (111)SI, Thin solid films, 261(1-2), 1995, pp. 107-114