Authors: TROLIERMCKINSTRY S CHINDAUDOM P VEDAM K HIREMATH BV

Citation: S. Troliermckinstry et al., CHARACTERIZATION OF OPTICAL THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY, Journal of the American Ceramic Society, 78(9), 1995, pp. 2412-2416

Authors: CHINDAUDOM P VEDAM K

Citation: P. Chindaudom et K. Vedam, CHARACTERIZATION OF INHOMOGENEOUS TRANSPARENT THIN-FILMS ON TRANSPARENT SUBSTRATES BY SPECTROSCOPIC ELLIPSOMETRY - REFRACTIVE-INDEXES N(LAMBDA) OF SOME FLUORIDE COATING MATERIALS, Applied optics, 33(13), 1994, pp. 2664-2671

Authors: CHINDAUDOM P VEDAM K

Citation: P. Chindaudom et K. Vedam, STUDIES ON INHOMOGENEOUS TRANSPARENT OPTICAL COATINGS ON TRANSPARENT SUBSTRATES BY SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 234(1-2), 1993, pp. 439-442

Authors: TROLIERMCKINSTRY S HU H KRUPANIDHI SB CHINDAUDOM P VEDAM K NEWNHAM RE

Citation: S. Troliermckinstry et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES ON ION-BEAM SPUTTER-DEPOSITED PB(ZR, TI)O3 FILMS ON SAPPHIRE AND PT-COATED SILICON SUBSTRATES, Thin solid films, 230(1), 1993, pp. 15-27

Authors: CHINDAUDOM P VEDAM K

Citation: P. Chindaudom et K. Vedam, DETERMINATION OF THE OPTICAL FUNCTION N(LAMBDA) OF VITREOUS SILICA BYSPECTROSCOPIC ELLIPSOMETRY WITH AN ACHROMATIC COMPENSATOR, Applied optics, 32(31), 1993, pp. 6391-6398