Authors: VANDENBOSSCHE G SOBRY R FONTAINE F CLACENS JM GABELICA Z

Citation: G. Vandenbossche et al., CHARACTERIZATION OF HEXAGONAL AND LAMELLAR MESOPOROUS SILICAS, ALUMINOSILICATES AND GALLOSILICATES BY SMALL-ANGLE X-RAY-SCATTERING, Journal of applied crystallography, 30, 1997, pp. 1065-1074