G. Vandenbossche et al., CHARACTERIZATION OF HEXAGONAL AND LAMELLAR MESOPOROUS SILICAS, ALUMINOSILICATES AND GALLOSILICATES BY SMALL-ANGLE X-RAY-SCATTERING, Journal of applied crystallography, 30, 1997, pp. 1065-1074
Various mesoporous silicas and the corresponding aluminosilicates or g
allosilicates have been synthesized using a series of literature or 'h
ome-made' recipes. The efficiency of Al or Ga incorporation into the s
iliceous walls of these materials depends markedly on the trivalent so
urce and the evolution (ageing) of the so-formed Si-M-III gel-type pha
ses at different starting pH values and temperatures, after adding the
surfactant-structuring compounds. Crystallization at low temperature
(e.g. <373 K) yielded mesoporous compounds with hexagonal topology (MC
M-41 type), involving double-layered Si walls possibly partly substitu
ted by Al or Ga. Such structures remain stable after calcination in ai
r at 873 K. When the same gels are crystallized at 423 K for 2 d, lame
llar frameworks (MCM-50 type) are preferentially stabilized. They read
ily collapse on heating. The ultra-small-angle X-ray scattering (USAXS
) data and the first part of the SAXS data show a power behaviour that
indicates a fractal interface before calcination. After calcination,
in the case of MCM-50 type materials, the fractal dimension significan
tly increases, the fractality region being larger than in the precurso
r. By contrast, in the case of the MCM-41 type materials, the fractal
region tends to disappear after calcination. The second part of the SA
XS curve reflects the hexagonal or lamellar structure. Some precursors
simultaneously exhibit both structures. The hexagonal parameter range
s from 4.6 to 5.8 nm, while the thickness of the wall is estimated to
be of the order of 0.7 nm from observations of the satellite peaks in
the vicinity of the successive peaks characterizing the hexagonal arra
y. The successive peaks relative to the lamellar structure are consist
ent with the superposition of two or three layers, the thicknesses of
which are of the order of 3.3, 2.85 and 2.5 nm. Predominant hexagonal
structures are maintained after calcination while lamellar structures
collapse during calcination. In the case of hexagonal structure, the h
exagonal array is slightly contracted.