Authors: BELLENS R CLEMMINCK I VANDOORSELAER K

Citation: R. Bellens et al., BUILDING-IN RELIABILITY DURING LIBRARY DEVELOPMENT - HOT-CARRIER DEGRADATION IS NO LONGER A PROBLEM OF THE TECHNOLOGISTS ONLY, Microelectronics and reliability, 37(10-11), 1997, pp. 1425-1428

Authors: VANCAMP R VANDOORSELAER K CLEMMINCK I

Citation: R. Vancamp et al., RELIABILITY OF A FOCUSED ION-BEAM REPAIR ON DIGITAL CMOS CIRCUITS, Microelectronics and reliability, 36(11-12), 1996, pp. 1787-1790