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PAWLACZYK CZ
BROOKS K
LANDIVAR M
COLLA E
SETTER N
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KHOLKIN A
COLLA E
BROOKS K
MURALT P
KOHLI M
MAEDER T
TAYLOR D
SETTER N
Citation: A. Kholkin et al., INTERFEROMETRIC STUDY OF PIEZOELECTRIC DEGRADATION IN FERROELECTRIC THIN-FILMS, Microelectronic engineering, 29(1-4), 1995, pp. 261-264
Citation: P. Hotz et al., QUANTITATIVE MARGIN ANALYSIS OF CLASS-II COMPOSITE RESTORATIONS IN-VITRO - INFLUENCE OF THE BEVELLING METHOD AND THE MATRIX BAND, Journal of dental research, 74, 1995, pp. 494-494
Citation: Ak. Tagantsev et al., IDENTIFICATION OF PASSIVE LAYER IN FERROELECTRIC THIN-FILMS FROM THEIR SWITCHING PARAMETERS, Journal of applied physics, 78(4), 1995, pp. 2623-2630
Authors:
ZURMUHLEN R
PETZELT J
KAMBA S
VOITSEKHOVSKII VV
COLLA E
SETTER N
Citation: R. Zurmuhlen et al., DIELECTRIC-SPECTROSCOPY OF BA(B'B-1 2''(1/2))O-3 COMPLEX PEROVSKITE CERAMICS - CORRELATIONS BETWEEN IONIC PARAMETERS AND MICROWAVE DIELECTRIC-PROPERTIES .1. INFRARED REFLECTIVITY STUDY (10(12)-10(14) HZ)/, Journal of applied physics, 77(10), 1995, pp. 5341-5350
Authors:
ZURMUHLEN R
COLLA E
DUBE DC
PETZELT J
REANEY I
BELL A
SETTER N
Citation: R. Zurmuhlen et al., STRUCTURE OF BA(Y1 2(+3)TA1/2(+5))O-3 AND ITS DIELECTRIC-PROPERTIES IN THE RANGE 10(2)-10(14)-HZ, 20-600-K/, Journal of applied physics, 76(10), 1994, pp. 5864-5873