Authors: JOHS B HERZINGER CM DINAN JH CORNFELD A BENSON JD

Citation: B. Johs et al., DEVELOPMENT OF A PARAMETRIC OPTICAL-CONSTANT MODEL FOR HG1-XCDXTE FORCONTROL OF COMPOSITION BY SPECTROSCOPIC ELLIPSOMETRY DURING MBE GROWTH, Thin solid films, 313, 1998, pp. 137-142

Authors: JOHS B HERZINGER C DINAN JH CORNFELD A BENSON JD DOCTOR D OLSON G FERGUSON I PELCZYNSKI M CHOW P KUO CH JOHNSON S

Citation: B. Johs et al., REAL-TIME MONITORING AND CONTROL OF EPITAXIAL SEMICONDUCTOR GROWTH INA PRODUCTION ENVIRONMENT BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 490-495

Authors: TADAYON S METZE G CORNFELD A PANDE K HUANG H TADAYON B

Citation: S. Tadayon et al., APPLICATION OF MICRO-AIRBRIDGE ISOLATION IN HIGH-SPEED HBT FABRICATION, Electronics Letters, 29(1), 1993, pp. 26-27