Authors: CARLUCCIO R CORRADETTI A FORTUNATO G REITA C LEGAGNEUX P PLAIS F PRIBAT D

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Authors: CORRADETTI A LEONI R CARLUCCIO R FORTUNATO G REITA C PLAIS F PRIBAT D

Citation: A. Corradetti et al., EVIDENCE OF CARRIER NUMBER FLUCTUATION AS ORIGIN OF 1 F NOISE IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS/, Applied physics letters, 67(12), 1995, pp. 1730-1732