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Results: 1-9 |
Results: 9
AN OPTICAL STUDY OF THE ATHERMAL PHOTO-AMORPHIZATION OF AS50SE50 THIN-FILMS
Authors: CORRALES C RAMIREZMALO JB MARQUEZ E JIMENEZGARAY R
Citation: C. Corrales et al., AN OPTICAL STUDY OF THE ATHERMAL PHOTO-AMORPHIZATION OF AS50SE50 THIN-FILMS, Materials science & engineering. B, Solid-state materials for advanced technology, 47(2), 1997, pp. 119-126
A NEW STUDY OF THE REFRACTIVE-INDEX DISPERSION OF AG-PHOTODOPED THIN-FILMS OF AS30S70 CHALCOGENIDE GLASS
Authors: RAMIREZMALO JB MARQUEZ E CORRALES C FERNANDEZPENA J REYES J VILLARES P JIMENEZGARAY R
Citation: Jb. Ramirezmalo et al., A NEW STUDY OF THE REFRACTIVE-INDEX DISPERSION OF AG-PHOTODOPED THIN-FILMS OF AS30S70 CHALCOGENIDE GLASS, Materials chemistry and physics, 44(2), 1996, pp. 186-189
ON THE AG-PHOTODISSOLUTION PHENOMENON IN AS0.35S0.65 CHALCOGENIDE GLASS-FILMS
Authors: FERNANDEZPENA J RAMIREZMALO JB RUIZPEREZ JJ CORRALES C MARQUEZ E VILLARES P JIMENEZGARAY R
Citation: J. Fernandezpena et al., ON THE AG-PHOTODISSOLUTION PHENOMENON IN AS0.35S0.65 CHALCOGENIDE GLASS-FILMS, Journal of non-crystalline solids, 196, 1996, pp. 173-177
OPTICAL-PROPERTIES OF AS50SE50 SEMICONDUCTING GLASS-FILMS OF NONUNIFORM THICKNESS DEPOSITED BY THERMAL EVAPORATION
Authors: RAMIREZMALO JB CORRALES C MARQUEZ E REYES J FERNANDEZPENA J VILLARES P JIMENEZGARAY R
Citation: Jb. Ramirezmalo et al., OPTICAL-PROPERTIES OF AS50SE50 SEMICONDUCTING GLASS-FILMS OF NONUNIFORM THICKNESS DEPOSITED BY THERMAL EVAPORATION, Materials chemistry and physics, 40(1), 1995, pp. 30-36
OPTICAL-CONSTANTS OF THERMALLY EVAPORATED AMORPHOUS GESE3 THIN-FILMS
Authors: REYES J MARQUEZ E RAMIREZMALO JB CORRALES C FERNANDEZPENA J VILLARES P JIMENEZGARAY R
Citation: J. Reyes et al., OPTICAL-CONSTANTS OF THERMALLY EVAPORATED AMORPHOUS GESE3 THIN-FILMS, Journal of Materials Science, 30(16), 1995, pp. 4133-4137
DETERMINING THE REFRACTIVE-INDEX AND AVERAGE THICKNESS OF ASSE SEMICONDUCTING GLASS-FILMS FROM WAVELENGTH MEASUREMENTS ONLY
Authors: CORRALES C RAMIREZMALO JB FERNANDEZPENA J VILLARES P SWANEPOEL R MARQUEZ E
Citation: C. Corrales et al., DETERMINING THE REFRACTIVE-INDEX AND AVERAGE THICKNESS OF ASSE SEMICONDUCTING GLASS-FILMS FROM WAVELENGTH MEASUREMENTS ONLY, Applied optics, 34(34), 1995, pp. 7907-7913
OPTICAL CHARACTERIZATION OF AS2S3 AND AS2SE3 SEMICONDUCTING GLASS-FILMS OF NONUNIFORM THICKNESS FROM TRANSMISSION MEASUREMENTS
Authors: RAMIREZMALO JB MARQUEZ E CORRALES C VILLARES P JIMENEZGARAY R
Citation: Jb. Ramirezmalo et al., OPTICAL CHARACTERIZATION OF AS2S3 AND AS2SE3 SEMICONDUCTING GLASS-FILMS OF NONUNIFORM THICKNESS FROM TRANSMISSION MEASUREMENTS, Materials science & engineering. B, Solid-state materials for advanced technology, 25(1), 1994, pp. 53-59
ON THE REVERSIBLE AND ATHERMAL PHOTO-VITRIFICATION PHENOMENON OF AS50SE50 CHALCOGENIDE THIN-FILMS
Authors: MARQUEZ E CORRALES C RAMIREZMALO JB REYES J FERNANDEZPENA J VILLARES P JIMENEZGARAY R
Citation: E. Marquez et al., ON THE REVERSIBLE AND ATHERMAL PHOTO-VITRIFICATION PHENOMENON OF AS50SE50 CHALCOGENIDE THIN-FILMS, Materials letters, 20(3-4), 1994, pp. 183-187
THERMOELECTRIC AND HALL-EFFECT IN AMORPHOUS ALLOY AS0.20SE0.40TE0.40
Authors: HARO M CORRALES C VILLARES P MARQUEZ E JIMENEZGARAY R
Citation: M. Haro et al., THERMOELECTRIC AND HALL-EFFECT IN AMORPHOUS ALLOY AS0.20SE0.40TE0.40, Materials letters, 17(5), 1993, pp. 263-267
Risultati: 1-9 |