Authors: LOMBARDO S CRUPI F LAMAGNA A SPINELLA C TERRASI A LAMANTIA A NERI B

Citation: S. Lombardo et al., ELECTRICAL AND THERMAL TRANSIENT DURING DIELECTRIC-BREAKDOWN OF THIN OXIDES IN METAL-SIO2-SILICON CAPACITORS, Journal of applied physics, 84(1), 1998, pp. 472-479

Authors: CRUPI F DEGRAEVE R GROESENEKEN G NIGAM T MAES HE

Citation: F. Crupi et al., ON THE PROPERTIES OF THE GATE AND SUBSTRATE CURRENT AFTER SOFT BREAKDOWN IN ULTRATHIN OXIDE LAYERS, I.E.E.E. transactions on electron devices, 45(11), 1998, pp. 2329-2334