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Authors: CURRENT M KUMP M MCGUIRE G
Citation: M. Current et al., PAPERS FROM THE 4TH INTERNATIONAL WORKSHOP ON THE MEASUREMENT AND CHARACTERIZATION OF ULTRA-SHALLOW DOPING PROFILES IN SEMICONDUCTORS - 6-9APRIL 1997 MCNC, CENTER-FOR-MICROELECTRONICS RESEARCH-TRIANGLE-PARK, NORTH-CAROLINA - PREFACE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(1), 1998, pp. 259-259

Authors: CURRENT M
Citation: M. Current, INTERNATIONAL WORKSHOP ILLUSTRATES PROGRESS IN DETERMINATION OF 2-D DOPANT PROFILES, MRS bulletin, 20(6), 1995, pp. 58-58
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