Authors:
CYTERMANN C
HOLZMAN E
BRENER R
FASTOW M
EIZENBERG M
GLUCK M
KIBBEL H
KONIG U
Citation: C. Cytermann et al., DOPANTS EFFECTS ON THE INTERFACIAL REACTION BETWEEN CO AND STRAINED SI0.8GE0.2 LAYERS, Journal of applied physics, 83(4), 1998, pp. 2019-2024
Authors:
HOFFMAN A
BRENER R
GOUZMAN I
CYTERMANN C
GELLER H
LEVIN L
KENNY M
Citation: A. Hoffman et al., NITROGEN IMPLANTATION INTO GLASSY-CARBON AS AN ATTEMPT TO GROW A CARBON NITRIDE THIN-FILM, DIAMOND AND RELATED MATERIALS, 4(4), 1995, pp. 292-296
Citation: C. Cytermann et al., SEARCH FOR DIFFUSION OF LI IMPLANTS IN NATURAL AND POLYCRYSTALLINE CVD DIAMOND, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 677-680
Authors:
HOFFMAN A
GELLER H
GOUZMAN I
CYTERMANN C
BRENER R
KENNY M
Citation: A. Hoffman et al., FORMATION OF CARBON NITRIDE FILMS BY HIGH-ENERGY NITROGEN ION-IMPLANTATION INTO GLASSY-CARBON, Surface & coatings technology, 68, 1994, pp. 616-620
Citation: I. Gouzman et al., IRRADIATION EFFECTS INDUCED BY REACTIVE AND NONREACTIVE LOW-ENERGY ION IRRADIATION OF GRAPHITE - AN ELECTRON-SPECTROSCOPY STUDY, Surface and interface analysis, 22(1-12), 1994, pp. 524-527
Citation: A. Hoffmann et al., EXTENDED FINE-STRUCTURE IN THE SECONDARY-ELECTRON EMISSION-SPECTRA OFGRAPHITE AND GLASSY-CARBON, Surface and interface analysis, 22(1-12), 1994, pp. 590-593
Authors:
EDELMAN F
CYTERMANN C
BRENER R
EIZENBERG M
KHAIT YL
WEIL R
BEYER W
Citation: F. Edelman et al., CRYSTALLIZATION IN FLUORINATED AND HYDROGENATED AMORPHOUS-SILICON THIN-FILMS, Journal of applied physics, 75(12), 1994, pp. 7875-7880