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Results: 1-15 |
Results: 15

Authors: SHAMIR N RITTER D CYTERMANN C
Citation: N. Shamir et al., BERYLLIUM DOPED INP INGAASP HETEROJUNCTION BIPOLAR-TRANSISTORS/, Solid-state electronics, 42(11), 1998, pp. 2039-2045

Authors: CYTERMANN C HOLZMAN E BRENER R FASTOW M EIZENBERG M GLUCK M KIBBEL H KONIG U
Citation: C. Cytermann et al., DOPANTS EFFECTS ON THE INTERFACIAL REACTION BETWEEN CO AND STRAINED SI0.8GE0.2 LAYERS, Journal of applied physics, 83(4), 1998, pp. 2019-2024

Authors: HOFFMAN A BRENER R GOUZMAN I CYTERMANN C GELLER H LEVIN L KENNY M
Citation: A. Hoffman et al., NITROGEN IMPLANTATION INTO GLASSY-CARBON AS AN ATTEMPT TO GROW A CARBON NITRIDE THIN-FILM, DIAMOND AND RELATED MATERIALS, 4(4), 1995, pp. 292-296

Authors: GLUCK M SCHUPPEN A ROSLER M HEINRICH W HERSENER J KONIG U YAM O CYTERMANN C EIZENBERG M
Citation: M. Gluck et al., COSI2 AND TISI2 FOR SI SIGE HETERODEVICES, Thin solid films, 270(1-2), 1995, pp. 549-554

Authors: COHEN GM RITTER D CYTERMANN C
Citation: Gm. Cohen et al., HIGH PEAK TUNNEL CURRENT-DENSITY GA0.47IN0.53AS ESAKI DIODES, Electronics Letters, 31(17), 1995, pp. 1511-1512

Authors: UZANSAGUY C CYTERMANN C BRENER R RICHTER V SHAANAN M KALISH R
Citation: C. Uzansaguy et al., DAMAGE THRESHOLD FOR ION-BEAM-INDUCED GRAPHITIZATION OF DIAMOND, Applied physics letters, 67(9), 1995, pp. 1194-1196

Authors: EDELMAN F BRENER R CYTERMANN C EIZENBERG M WEIL R BEYER W
Citation: F. Edelman et al., FAST INTERFACIAL OXIDATION OF AMORPHOUS SI1-XGEX-H BY SNO2, Applied physics letters, 67(3), 1995, pp. 389-391

Authors: CYTERMANN C BRENER R KALISH R
Citation: C. Cytermann et al., SEARCH FOR DIFFUSION OF LI IMPLANTS IN NATURAL AND POLYCRYSTALLINE CVD DIAMOND, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 677-680

Authors: HOFFMAN A GELLER H GOUZMAN I CYTERMANN C BRENER R KENNY M
Citation: A. Hoffman et al., FORMATION OF CARBON NITRIDE FILMS BY HIGH-ENERGY NITROGEN ION-IMPLANTATION INTO GLASSY-CARBON, Surface & coatings technology, 68, 1994, pp. 616-620

Authors: GOUZMAN I BRENER R CYTERMANN C HOFFMAN A
Citation: I. Gouzman et al., IRRADIATION EFFECTS INDUCED BY REACTIVE AND NONREACTIVE LOW-ENERGY ION IRRADIATION OF GRAPHITE - AN ELECTRON-SPECTROSCOPY STUDY, Surface and interface analysis, 22(1-12), 1994, pp. 524-527

Authors: HOFFMANN A BRENER R CYTERMANN C
Citation: A. Hoffmann et al., EXTENDED FINE-STRUCTURE IN THE SECONDARY-ELECTRON EMISSION-SPECTRA OFGRAPHITE AND GLASSY-CARBON, Surface and interface analysis, 22(1-12), 1994, pp. 590-593

Authors: EDELMAN F CYTERMANN C BRENER R EIZENBERG M KHAIT YL WEIL R BEYER W
Citation: F. Edelman et al., CRYSTALLIZATION IN FLUORINATED AND HYDROGENATED AMORPHOUS-SILICON THIN-FILMS, Journal of applied physics, 75(12), 1994, pp. 7875-7880

Authors: EDELMAN F CYTERMANN C BRENER R EIZENBERG M WEIL R BEYER W
Citation: F. Edelman et al., INTERFACIAL PROCESSES IN THE PD A-GE-H SYSTEM, Applied surface science, 70-1, 1993, pp. 722-726

Authors: EDELMAN F CYTERMANN C BRENER R EIZENBERG M WEIL R BEYER W
Citation: F. Edelman et al., INTERFACIAL REACTIONS IN THE A-SI1-XGEX-H CR/QUARTZ SYSTEM/, Journal of non-crystalline solids, 166, 1993, pp. 27-30

Authors: EDELMAN F CYTERMANN C BRENER R EIZENBERG M WEIL R BEYER W
Citation: F. Edelman et al., HINDERED TRANSFORMATION OF PD2GE TO PDGE IN THE PD A-GEH SYSTEM/, Journal of applied physics, 73(12), 1993, pp. 8309-8312
Risultati: 1-15 |