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Results:
1-9
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Results: 9
Authors:
Frohlich, F
Machajdik, D
Cambel, V
Fedor, J
Pisch, A
Lindner, J
Citation: F. Frohlich et al., Growth of Ru and RuO2 films by metal-organic chemical vapour deposition, J PHYS IV, 11(PR3), 2001, pp. 325-332
Authors:
Elias, P
Cambel, V
Hasenohrl, S
Kostic, I
Citation: P. Elias et al., OMCVD growth of InP and InGaAs on InP non-planar substrates patterned with{110} quasi facets, J CRYST GR, 233(1-2), 2001, pp. 141-149
Authors:
Karapetrov, G
Cambel, V
Kwok, WK
Crabtree, GW
Zheng, H
Veal, BW
Citation: G. Karapetrov et al., Contactless characterization of melt-textured superconducting junctions using micro-Hall sensor arrays, PHYSICA B, 284, 2000, pp. 2065-2066
Authors:
Cambel, V
Karapetrov, G
Elias, P
Hasenohrl, S
Kwok, WK
Krause, J
Manka, J
Citation: V. Cambel et al., Approaching the pT range with a 2DEG InGaAs/InP Hall sensor at 77 K, MICROEL ENG, 51-2, 2000, pp. 333-342
Authors:
Elias, P
Hasenojhrl, S
Cambel, V
Kostic, I
Citation: P. Elias et al., Crystallographic dependence of OMVPE InGaAs/InP lateral growth on patterned (100) InP substrates prepared by wet etching, THIN SOL FI, 380(1-2), 2000, pp. 105-107
Authors:
Kovac, P
Cambel, V
Bukva, P
Citation: P. Kovac et al., Measuring the homogeneity of Bi(2223)/Ag tapes by four-probe method and a Hall probe array, SUPERCOND S, 12(7), 1999, pp. 465-471
Authors:
Elias, P
Cambel, V
Hasenohrl, S
Hudek, P
Novak, J
Citation: P. Elias et al., SEM and AFM characterisation of high-mesa patterned InP substrates prepared by wet etching, MAT SCI E B, 66(1-3), 1999, pp. 15-20
Authors:
Novak, J
Hasenohrl, S
Cambel, V
Kucera, M
Wehmann, HH
Wullner, D
Citation: J. Novak et al., Electrical and morphological properties of ordered InxGa1-xP, MAT SCI E B, 66(1-3), 1999, pp. 102-105
Authors:
Karapetrov, G
Cambel, V
Kwok, WK
Nikolova, R
Crabtree, GW
Zheng, H
Veal, BW
Citation: G. Karapetrov et al., Contactless characterization of melt-textured superconducting junctions using micro-Hall sensor arrays, J APPL PHYS, 86(11), 1999, pp. 6282-6286
Risultati:
1-9
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