Authors: De Salvo, B Ghibaudo, G Pananakakis, G Guillaumot, B Candelier, P Reimbold, G

Citation: B. De Salvo et al., A new extrapolation law for data-retention time-to-failure of nonvolatile memories, IEEE ELEC D, 20(5), 1999, pp. 197-199

Authors: Goguenheim, D Bravaix, A Vuillaume, D Mondon, F Candelier, P Jourdain, M Meinertzhagen, A

Citation: D. Goguenheim et al., Experimental study of the quasi-breakdown failure mechanism in 4.5 nm-thick SiO2 oxides, MICROEL REL, 39(2), 1999, pp. 165-169

Authors: De Salvo, B Ghibaudo, G Pananakakis, G Reimbold, G Mondond, F Guillaumot, B Candelier, P

Citation: B. De Salvo et al., Experimental and theoretical investigation of nonvolatile memory data-retention, IEEE DEVICE, 46(7), 1999, pp. 1518-1524