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Results: 1-10 |
Results: 10
Anomalous diffraction with soft X-ray synchrotron radiation: DANES from pentakismethylammonium undecachlorodibismuthate at the K absorption edge of chlorine
Authors: Carpentier, P Capitan, M Chesne, ML Fanchon, E Kahn, R Lequien, S Stuhrmann, H Thiaudiere, D Vicat, J Zajac, W Zielinski, P
Citation: P. Carpentier et al., Anomalous diffraction with soft X-ray synchrotron radiation: DANES from pentakismethylammonium undecachlorodibismuthate at the K absorption edge of chlorine, J ALLOY COM, 328(1-2), 2001, pp. 64-70
In situ real-time analysis of the formation of a quasicrystalline phase inAl-Co multilayers by solid-state reaction
Authors: Bergman, C Joulaud, JL Capitan, M Clugnet, G Gas, P
Citation: C. Bergman et al., In situ real-time analysis of the formation of a quasicrystalline phase inAl-Co multilayers by solid-state reaction, J NON-CRYST, 287(1-3), 2001, pp. 193-196
Neutron and X-ray investigation of disordered quasicrystals
Authors: Hradil, K Scholpp, T Frey, F Haibach, T Estermann, MA Capitan, M
Citation: K. Hradil et al., Neutron and X-ray investigation of disordered quasicrystals, MAT SCI E A, 294, 2000, pp. 303-307
High resolution X-ray and neutron diffraction of super- and disorder in decagonal Al-Co-Ni
Authors: Weidner, E Hradil, K Frey, F de Boissieu, M Letoublon, A Morgenroth, W Krane, HG Capitan, M Tsai, AP
Citation: E. Weidner et al., High resolution X-ray and neutron diffraction of super- and disorder in decagonal Al-Co-Ni, MAT SCI E A, 294, 2000, pp. 308-314
Real time study of the quasicrystal formation in annealed Al-Cu-Fe metallic multilayers
Authors: Grenet, T Giroud, F Loubet, C Joulaud, JL Capitan, M
Citation: T. Grenet et al., Real time study of the quasicrystal formation in annealed Al-Cu-Fe metallic multilayers, MAT SCI E A, 294, 2000, pp. 838-841
Feasibility and review of anomalous X-ray diffraction at long wavelengths in materials research and protein crystallography
Authors: Kahn, R Carpentier, P Berthet-Colominas, C Capitan, M Chesne, ML Fanchon, E Lequien, S Thiaudiere, D Vicat, J Zielinski, P Stuhrmann, H
Citation: R. Kahn et al., Feasibility and review of anomalous X-ray diffraction at long wavelengths in materials research and protein crystallography, J SYNCHROTR, 7, 2000, pp. 131-138
Anomalous X-ray diffraction with soft X-ray synchrotron radiation
Authors: Carpentier, P Berthet-Colominas, C Capitan, M Chesne, ML Fanchon, E Lequien, S Stuhrmann, H Thiaudiere, D Vicat, J Zielinski, P Kahn, R
Citation: P. Carpentier et al., Anomalous X-ray diffraction with soft X-ray synchrotron radiation, CELL MOL B, 46(5), 2000, pp. 915-935
Crystallization of amorphous Si0.5Ge0.5 films studied by means of in-situ X-ray diffraction and in-situ transmission electron microscopy
Authors: Edelman, F Raz, T Komem, Y Zaumseil, P Osten, HJ Capitan, M
Citation: F. Edelman et al., Crystallization of amorphous Si0.5Ge0.5 films studied by means of in-situ X-ray diffraction and in-situ transmission electron microscopy, PHIL MAG A, 79(11), 1999, pp. 2617-2628
Nanostructured precipitates: Experimental versus exact theoretical SAXS profiles
Authors: Garrido, V Crespo, D Pineda, E Pradell, T Capitan, M
Citation: V. Garrido et al., Nanostructured precipitates: Experimental versus exact theoretical SAXS profiles, NANOSTR MAT, 12(5-8), 1999, pp. 649-652
Stability and transport properties of microcrystalline Si1-xGex films
Authors: Edelman, F Raz, T Komem, Y Stolzer, M Werner, P Zaumseil, P Osten, HJ Griesche, J Capitan, M
Citation: F. Edelman et al., Stability and transport properties of microcrystalline Si1-xGex films, THIN SOL FI, 337(1-2), 1999, pp. 152-157
Risultati: 1-10 |